MAINTENANCE OF(Sanitized)CHIP COMPARATOR

• Document Type: CREST
• Collection: NGA Records (Formerly NIMA)
• Document Number (FOIA) /ESDN (CREST): CIA-RDP78B04747A001500030049-0
• Release Decision: RIPPUB
• Original Classification: C
• Document Page Count: 1
• Document Creation Date: December 28, 2016
• Document Release Date: January 30, 2002
• Sequence Number: 49
• Publication Date: February 9, 1966
• Content Type: MFR

ME ORANDUM FOR THE RECORD
25X1A
5 - 7 7 6
February . >.6
Inc. - crforme4 the following maintenance on the Chip Comparator (4O5P
-erial number 1) in TAD.
SUBJECT: Maintenance of
Approved For ReleasCOULDE: x Ik 78B04747A001
Chip Co r.Rrr.tor
25X1A 1. on February, 8, 13661 a rep
a. Increased th ^ output of the high voltage circuit for both
the I and ' axis.
b. Replaced a printed circuit board in the X axis circuit.
a. Adjusted the D.C. level of interferometer output signals
for both axis.
25X1A
25X1A
Adjusted
25X1A
Trigger circuits for both axis.
2. was questioned as to why the 0 Trigger circuits
had to be adjusted frequently. He explained this problem could be caused
y change in ambient room temperature, or line voltage fluctuation, but ha" t
experienced this problem at other installations.
3. IN will a aintiain a record of all drift problems. Included in
this record will be the axis affected, any room temperature change, and the
amount and direction of adjust xt needed to correct the raroblem. When
enough data has been collected to varrent investigation of this problem,
the malfunction record will be sent tes for action.
&. A voltage regulator has been supplied by to be
used if the drifting problem is suspected to be caused by line voltage
fluctuation.
equipment is wcrwing correctly.
5. A daily test viii be performed by IAD to determine wheatber the
DECLASS REVIEW by NIMA/DOD
25X1A
25X1
a
25X1
EqU i 4 6
Approved For Release 2002/06/17 : CIA-RDP78BO4747AO0150003004
g~i I~61_
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