MODEL II, PROJECTED SCALE MICROMETER

• Document Type: CREST
• Collection: NGA Records (Formerly NIMA)
• Document Number (FOIA) /ESDN (CREST): CIA-RDP78B04747A002300060014-6
• Release Decision: RIPPUB
• Original Classification: S
• Document Page Count: 2
• Document Creation Date: December 28, 2016
• Document Release Date: July 16, 2001
• Sequence Number: 14
• Publication Date: January 7, 1965
• Content Type: FORM

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46 Approved For Release 20011/P8i / 1P)DP78BO474 A002300060014-6 c9
R & D CATALOG FORM
DATE
7 January 1965
I. PROJECT TITLE/CODE NAME
2. SHORT PROJECT DESCRIPTION A
attachment for the
Model II, Projected Scale
Zoom 70 Microstereoscop
that projects a measuring
Micrometer
reticle into the optica
system.
3. CONTRACTOR NA 4. LOCATION OF
ONTRACTOR
5. CLASS OF CONTRACTOR 6. TYPE OF CONTRACT
Manufacturer Fixed Price
7. FUNDS
8. REQUISITION NO.
9. BUDGET PROJECT NO.
FY. 1965
5500-8607-65
NP-M-1
FY 19 $
10. EFFECTIVE CONTRACT DATE
(Begin - end)
FY 19 $
Jan 1965 - June 1965
12. RESPONSIBLE DIRECTORATE/OFFICE/PROJECT OFFICER TELEPHONE EXTENSION
DDI/NPIC/P&DS 2610
13. REQUIREMENT/AUTHORITY
14. TYPE OF WORK TO BE DONE This project is an engineering de
velopment directed toward
the design and fabrication of a prototype Model II Proj
ected Scale Micrometer.
15. CATEGORIES OF EFFORT
MAJOR CATEGORY
SU
B-CATEGORIES
Measurement & Rectification
Optic
al Systems
Equipment
16. END ITEM OR SERVICES FROM THIS CONTRACT/IMPROVEMENT OVER CURRENT SYS
TEM, EQUIPMENT. ETC.
This project will result in one prototype, monthly prog
ress reports and an
instruction manual. This unit will be an advanced ver
ion of the prototype-built
for NPIC by under a previous contract. The Mode
II incorporates the most
desirable features of the original and introduces a n
ber of changes to simplify
17. SUPPORTING OR RELATED CONTRACTS (Agency & Other)/COORDINATION
By virtue of contracts throughout industry an
d the intelligence
community, it appears that no equivalent device exists
or is under development.
Declass Review by NIMA / DoD
18. DESCRIPTION OF INTELLIGENCE REQUIREMENT AND DETAILED TECHNICAL DESCR
IPTION OF PROJECT (Continue on addi-
tional page if required) Photographic interpretation op
erations present a continual
problem pertaining to comparative measurements of small
scale imagery. A device
to solve this problem should be precise, compact and r
latively inexpensive in
production quantities. The original unit was developed
with these requirements in
mind and was generally quite successful in proving the
desirability of the
projection-type measuring systems. The Model II is an
attempt to improve the human
engineering aspect of the original concept. (Continued
19. APPROVED BY AND DATE
OFFICE -
DEPUTY DIRECTOR ___._n
[DDC
I
2338 - .rr......_ .
1 FORM
SECRET ?:.~ n
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b. Both the image and the measuring mark m y be viewed while utilizing
the complete zoom magnification ranges of the mi roscope.
d. A mechanical counter displays the first three (3) digits; while,
the last two (2) digits are read from a graduate drum.
e. The measuring reticle can be rotated 18 n
0--
f. Increased reticle illumination is provided.
g. An azimuth ring has been added to permit measuring the angles between
converging lines.
Approved For Release 2001/08113: CIA-RDP78B0474~A002300060014-6
R & D CATALOG FORMS (Continued)
important improvement.
The Model II Projected Scale Micrometer wi
__ ~,_ _ r._,, 1~l be a prototype instrument
18. Technical Specifications
a. It is an attachment designed to fit on any standard Model II
-Zoom 70 Stereomicroscope.
Approved For Release 2001/08/13 : CIA-RDP78B047417A002300060014-6