ATTENTION GEORGE (SANITIZED)

• Document Type: CREST
• Collection: NGA Records (Formerly NIMA)
• Document Number (FOIA) /ESDN (CREST): CIA-RDP78B04770A001400070002-9
• Release Decision: RIPPUB
• Original Classification: S
• Document Page Count: 3
• Document Creation Date: December 28, 2016
• Document Release Date: June 27, 2006
• Sequence Number: 2
• Publication Date: February 20, 1969
• Content Type: LETTER

Approved For Release 2006/06/27: CIA-RDP78BO477OA001400070002-9
J'cbrnary 20, 1969
U. S, Govcrnym.enl:
Attention: George 1Ri.
Dear George:
I.'\.ccentiy you requested a, quotation for a 0. 5 power relay lens and cell as
a replacement unit in a ypc 880 or. 1210 binocular microscope
viewing system, a specaa z m. transport for thc Type 1032T
Microdcnsitonmeter, and service for the modification of your
Type 1032 Microdensitonmetcr digital. readout system..
to provide the following quotation:
We are pleased
Item 1
0. 5 [tttylay lens and cell to replace a 1-power relay -lens unit
in a pe 880 or.1210, 400 Series binocular microscope
viewing system. This lens provides approximately 200 lines per
millimeter resolution at 40X magnification, and changes the field
of view to 5 millim eters. The magnification ranges to 10 to 20X
with a 5X'eyepiece, and 20 to 40X with a lOX eyepiece. Apparent
reticle width to 5 microns at the film plane. Price includes neces-
sary instruction for customer installation.
densitorneter similar to film stage or 1/2" film furnished with
1032T07 except minus the upper pressure frames (clear and glass)
but to include. a special glass insert having a slot 9-1 /2" long x 5
Ii:crn ?,
Special. film transport (manual) fort Type 1032T Micro-
wide covered with a sheet of 010" thick glass.
Item 3
Modification of yourIType 1032 Microdensitometcr digital
readout system including equipment, services, and supplemental
drawings, to permit increase in density data sampling rate at
lower scan speeds as described belo-,,v.
STAT
STAT
STAT
DDR-Dupe
Approved For Release 2006/06/27: CIA-RDP78BO477OA001400070002-9
 Approved For Release 2006/06/27: CIA-RDP78B04770A001400070002-9
If. `y. Covernrucnt
- 2 - February 20, 1969
'I'll(: pro sent system provi.cles for selection of sampling intervals in increments
of one micron, and is li.m.n-ited by the resolution of the X and Y data heads.
To pcs ri~ri.t more frequent safil,ii.ng, it Will. be necessary to provide an external
hronous oscillator, shaping and resyncliroilizing circuits and swi.tc:h.iri
for ;cieeti.on of. the sampling sou.lr?ce.
The introduction of the external sauncpiLog signal Will be at a point in the
re:n,it- after the interval. cc,tniter. Thus, the coordinate values recorded on
t?:},~, at the be.gi.nning and end of the ,can will retain their proper si.gnif.icancc. 11
c;,,,rdinates of any sample in ay be determined to a reasonable degree of
r:+ c}? t> y into rpolatlon.
range variable frequency oscillator, such as tale Mode]:
;1 0--A v%?11 be used. as the sampling rate source. It will be provided -with a
type mount designed to replace one of the blank panels in the present
c1uipineiit rack. A switch for selection of external or internal sampling
source ~T ill be nnoun.ted with the oscillator.
For shaping, resynchronizing and gating, it is proposed that unused circuits
on the SDS cards in chassis A. and B of the present equipment be. utilized.
It is estimated that the necessary installation and Wiring may he completed
in the field within one clay.
The external ' sam pl.ing rate source will provide a resolution of over one
thousand samples per nii.cron when used at the lowest scan speed of 125
r'nicrorls per .minute..
The delivery schedule would be 30 days for Item 1 and 90 clays for. Items 2
a:r,d 3, after receipt of an order. Our terms are net 30 days, and all. prices
quoted are f.ob This quotation is firm for a period of STAT
60 days,
W' O trust this information is sufficient for your immediate action.
-Director of Marketing
ACT /bc
Approved For Release 2006/06/27: CIA-RDP78BO477OA001400070002-9
 Approved For Release 2006/oxz-Z ;l ~P F78B04770A 001400070002-9
R &.D CATALOG FORM 15 April 1969
t.
PROJECT TITLE/CODE NAME 2. SHORT PROJECT DESCRIPTION
Microdensitometer Modi- This ro ect is to fabricate a modified stage for
fications (Stage the p1 032T Microdensitometer operated at NPIC. STAT
Modification
3.
CONTRACTOR NAME 4. LOCATION OF CONTRACTOR
STAT
5.
CLASS OF CONTRACTOR 6. TYPE OF CONTRACT
Manufacturer FP
7.
FUNDS S. REQUISITION NO. 9. BUDGET PROJECT NO.
FY 19 68 $ None
10. EFFECTIVE CONTRACT DATE 11. SECURITY CLASS.
FY 19 69 $ I (Begin - end) A.A. - Confidential STAT
T. - Unclassified
FY 19 70 $ None May 1969 - July 1969 W. - Unclassified
12.
RESPONSIBLE DIRECTORATE/OFFICE/PROJECT OFFICER TELEPHONE EXTENSION
DDI/NPIC/TSSG/DEDI STAT
13.
REQU
The032T Trichromatic Microdensitometer has optical aberrations STAT
.caused by the-thick glass stage. These aberrations will have to be reduced
before any color film can be analyzed.
14.
TYPE OF WORK TO BE DONE
Engineering Development
15.
CATEGORIES OF EFFORT
MAJOR CATEGORY SUB-CATEGORIES
Precision Measurement Microdensitometry
Optical Systems
16.
END ITEM OR SERVICES FROM THIS CONTRACT/IMPROVEMENT OVER CURRENT SYSTEM. EQUIPMENT. ETC.
A modified stage will be produced by the manufacturer. This stage will
have a center section of very thin glass which will minimize the optical
problems caused by the existing glass stage.
17.
SUPPORTING OR RELATED CONTRACTS (Agency & Other)/COORDINATION This contract will run con-
currently with another contract to to improve the scan control and STA
sampling system. After completion o is contract, commercial lens systems will
be tried in the microdensitometer to reduce other optical aberrations;. if the re-
sults of this investigation are not satisfactory, a lens development will be
6
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tional pa a if required)
TheI 1032T Trichromatic Microdensitometer is an analytical instrument STA
used in the evaluation of film imagery. The instrument is also used to a
limited extent to "enhance" images to increase their intelligence value. At
present the instrument is virtually useless in analyzing color imagery because
of the aberrations in the optical system, the stage being a prime cause of these
aberrations. By minimizing the thickness of the stage the aberrations caused
by it will also be minimized.
19.
APPROVED BY AND DATE
OFFICE
DEPUTY DIRECTOR
DDCI
FORM 233$ SE~TF (11.13)
" 64 Approved For Release 2006/06127 IR-RDP OA001400070002-9