LINEAR PHASOLVER MEASURING ENGINE

Document Type: 
Document Number (FOIA) /ESDN (CREST): 
CIA-RDP78B04770A002900020051-4
Release Decision: 
RIPPUB
Original Classification: 
K
Document Page Count: 
3
Document Creation Date: 
December 28, 2016
Document Release Date: 
June 28, 2006
Sequence Number: 
51
Case Number: 
Publication Date: 
August 24, 1964
Content Type: 
REPORT
File: 
AttachmentSize
PDF icon CIA-RDP78B04770A002900020051-4.pdf175.26 KB
Body: 
Approved For Release 2006/06/28: CIA-RDP78B04770A002900020 51-4 August 24, 1964 LINEAR PHASOLVER MEASURING ENGINE ''h will be shut down for vacation from August 24 until after Labor Day, 8 September. The pattern master which was received fro August been measured ;3]y is out with the u an was in the middle of reviewing the measurement data. STAT STAT OTAT The patterns are not as good as they could be, but the question Pete is trying to resolve is whether they are good enough for submicron measuring. The first and second harmonic errors, if constant from pole to pole, will wash out electrically. Pete thinks that second harmonic errors are a result of bleeding during pattern exposure and development. Pete's tentative opinion is that the patterns are good enough to achieve 1/4 micron measurement resolution and they probably STAT should b t on to Ito prepare the working pattern. STAT He and however, wi have to discuss this thoroughly after care u review of the measurement data. A copy of instructions tol is enclosed. OTAT It illustrates the pattern at double scale. is simple set of measurements generates so much data that it-is a real chore to assimilate it and judge the pattern quality. It is expected I Iwill take a month to prepare the working STAT driver and then will require one to two months for STAT setup and trial. it looks like the demonstration will not take place before November. Since thel has been doing a STAT good job, oug Heir o er divisions might have applicable talents and their general brochure is enclosed. The only other o ibi i - see would be computer programs from It is extremely difficult, STAT however, to use that type of service. DDR-NOTA PUPE Enclosures Approved For Release 2006/06/28: CIA-RDP78B04770A002900020051-4 L uvTioi i rUH THE i"1EASUh OF LIIft Art i'HASOLVErt PATTERN CONSI fl OF 1000-2405 and 1000-2408 ? Pattern 1000-240 p. 1 1) Tabu1tte 21 consecutive measurements of sine wave heist (Y axis) Vs. equal increments of .050 mm in X. The starting point should be the Average of min. & rnax. values of Y. T' is procedure is to be repeated a total of 3 times within this pattern as noted A. B, and C on page 2. A and B denote two non-adjacent sine waves near the center of the pattern. C is the same sine wave as A I* but near the and of the pattern. 2) Measure the a;iadrature (phase displacement) at one place on the pattern as shown at D on nRge 2. Pattern 1000--21.08 3) Tabulate 21 measurements as in 1) above 3 places, 13, F, and G ? on paa:e 2. E and F are two non-adjacent sine waves near the center of the pattern. G is the same sine wave as E but near the end of the pattern. Measure from datum line in plus Y direction only. t}) Measure the quadrature (phase displacement) in six places, three in each half of the pattern as shown in H, Is, J and K, L, M. ? Approved For Release 2006/06/28 :A-RDP78B04770A002900020051-4 -2` dy5