TEST GRIDS FOR(Sanitized)STEREOCOMPARATOR

• Document Type: CREST
• Collection: NGA Records (Formerly NIMA)
• Document Number (FOIA) /ESDN (CREST): CIA-RDP78B05171A000100010062-0
• Release Decision: RIPPUB
• Original Classification: S
• Document Page Count: 3
• Document Creation Date: December 28, 2016
• Document Release Date: September 8, 2003
• Sequence Number: 62
• Publication Date: April 7, 1969
• Content Type: MF

Approved For Release ~j1 4 : CIA-RDP78BO5171A000100010062-0
NPIC/TSSG/ESD/EL-3269
7 April 1969
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MEMORANDUM FOR: Chief, Development and Engineering Division, TSSG
SUBJECT: Test Grids for l Stereocomparator
1. The Exploratory Laboratory has completed production of
60 test grids for TSSG/DED. These grids will be used to check out
various optical components on the0 Stereocomparator currently
under development. will use some of the
grids immediately in building the optics for the system. 0 and
ESD/TEB will, use them in their future tests.
2. Forty anamorphic grids photographically reduced to four
different sizes (6.67X, 1OX, 20X, 60X) from a master target, 8.618"
X 10.00", have been made. Ten plates of each size constitute the
forty grids. The Cartographic Division at Headquarters produced
the master target for the Exploratory Laboratory from a design sub-
mitted by DED personnel.
3. A concentric circle test grid was photographically reduced
113.2X from a pattern submitted by ESD/TEB in January, 1969. Ten
plates of this pattern were fabricated by EL personnel.
4. Ten plates containing a hexagonal dot array with a maximum
of 11 dots across the pattern were also produced. Four of the end
products contain the 11 dots within 2 millimeters (188X reduction
in two steps) and six contain the 11 dots within a spacing of 10
millimeters (37.6X reduction in two steps). The first reduction in
each case was 6X.
5. The various anamorphic grids and the concentric circle
pattern were all produced within a pre-determined tolerance of 0.10%.
Grids of each reduction size were measured to the nearest micron on
the Point Transfer Device by photogrammetric personnel. The dot array
reductions were made as close as possible to 2 mm. and 10 mm., but
no measurements were made as the tolerance was not as rigid.
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Declass Review by
NIMA/DOD
GROUP i NPIC/TSSG/ESD/EL
Excluded from aaatommwtlt
Approved ~~ET For Rele sedaecasat c~e~n'0 :CIA-RDP78B05171A000100010062-0
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Approved For ReleasegbUI 2/04: CIA-RDP78BO5171A000100010062-0
0
Stereocomparator
Distribution:
Original -
TSSG/DED
1 -
TSSG/DED Info Copy
1 -
TSSG/ESD
1 -
TSSG/ESD/TEB
1 -
TSSG/ESD/EL
ZH U
Approved For Release 2003/12/04 CIA-RDP78BO5171A000100010062-0
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