THE USE OF GE AND 31 SINGLE CRYSTALS FOR PRECISION MEASUREMENT IN X-RAY SPECTROSCOPY

• Document Type: CREST
• Collection: General CIA Records
• Document Number (FOIA) /ESDN (CREST): CIA-RDP80T00246A007800390002-2
• Release Decision: RIPPUB
• Original Classification: U
• Document Page Count: 5
• Document Creation Date: December 22, 2016
• Document Release Date: July 21, 2009
• Sequence Number: 2
• Publication Date: October 7, 1959
• Content Type: REPORT

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in X-raX Spectroscopy.
Institute of Technical PhvqicL;9 P,-a,.7-ie
In our laboratory the
bond on the K group lines of transition e>wents. ReceiAlY we
have made ?
ti. - . double spectrometer.
Malloof
for X-ray spectroscopy.
shown ? precision measurements on (111) pL-aie-, of
the .- 1 . 11 crystals 1
could be expected with silicon crystals.
We -Arere looking for crystpils P riving r.
arrangement and sufficient ? . ?
reqiAre-
ments are quite well ? 1
crystals, cut parallel to the (220) vlane. its the resolving power
of the double spectrometer ?
? to or higher than with cilcite 1 -or i'C-:A
follows ? measurement of lino sblpes.
? measurements primary `' ? and Fe K ? ?
ystal spectrometer with G11,-counters, were kise(l. "he
and double cr
power supply was ? . ?
11
was
maximal ? of the X-ray ? 1
/radians/. .. ? /1,1/ the horizontal
gence was about 0,C5 radians.
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P P 10-3, -3
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TENKICS VItSTEV 2ELEZA
gTR QKTLTRA AKUO V2 NAYACS
ch ferrornagt-etick$~eh vrstev le nutnkter66 znbt
a hle-
rsteV'~eleza,
pfi studiu maRr-etickych vlas ti urSit strukturu tenkych v ili
okusili lame se proto j fi rav vyllafenim
y teleza am e p
jejich strukturu. odlozku sou6asnbm ck*ch Ph .
disks > etM o usili nosti prwg studujeme. Vrstv l1fiv6Tlf
k6m vskuu (p < 10-4 mmHg) ssklme pengnou outil pi p~skl] 6iet6ho teleza, ktm P
ve Vyw i It'v j ,me ass 1470 ?C. P&Bky teleza j
ae. na 300 -Cl K napsf en
olllzi dm p&chodem eektrickgho proudu nadobP dvou hodin, aby ee uvolnilY ne6istoty
pv?y sti
lastnim nan~enim vrstev. HotoV6
lam ~pafov vrstev ~,y vali Po oLali s v
v apatY. An Po t t ' dobg Jame teprve p
z jejich Po
difrakdni enimek tenkg vrstvy teleza.
1 Elektronovy
O b
r. .
ovnala
vmtvy jams ponechali delgi dobu uvnitf vakuuve aparatury, ki Be jejich teplota k 6ho
s teplotou okoli. sme poficlili elektronovym difraktografem VY
Z takto ziskan+ch vrstev 1 u dvou vzorkA, jejichi tlou5tky urLenA interfovedli
ocetodo6ho &tavU ohybov6 enimky = 2340 A. Elektronovou difrakei jsme pr
I a = 3450 A, (II) 8
metodu [1] byly: () padu elekt,0517 A). na r l kubickouf mfitku pro -
ph t6mgf tangenclAl, do 0,0617 A)). SSunk nimky ukazu]i na (obr. 1); n,fitko-
jejicA, 12 = e u obou vzork,5 14ping eouhlsan cot v r~mci pfes-
vych d6centr (A1 = 0 U 0554
ich charakter je kruhil je a = 2,88 A, ptes
niho
storovg centrovanoun~J z ~olomgl dlfraki5n
'e v souhlase s hodnotou mfftkov6 konetantY kompa
nstanta vi kc
no
Hosti ts exp ezperi riment ntA nick $dal j O velmi vyraznk textura. Jak z dalgich
teleza a = 2,866 A. Z do6r-ich snimkf je Pa ' to jejich krystalo-
l 1 Vkn tvg zaou orientov~lly sou [ jejich kry ro-i
$vah vyplyne, jde u obou vz vzor" o k
te kry tsY l e v ni nahodile oriento i ne Po-
graf k6 rovi Y (11 sO ,
raficje rookoi (111) 1) jsou rovnobgtn6 s rovern t xturni V fereonbr. 2 jsou znmzor
tvrzu)'e to olnost, to otggeAim vzorku koleexturni c>oY tuL~eng)glli obraz Hem n poloz nSny fr enimek pofizeny v jedn6 rone a v poloze o 90
difrsk6nf krutnice jednotlivycp interfere rbolickych * tevnicf h?I dexy reflexi j de
gny lets mists zhu&tgni na hype >
ocllnineV
o 46 $~ enimek, u. ] spit uji 1
na n-t vrstevnici a indexy texturnhu + kv + lw = ii ,
ktera pro texturni osu [111] ma tear h + k + d __ '1
pro n = 2, 4, 6, . vzhledem k tomu, le perio,da identity ; ti 1111ve sTn6,ru tglesnl~ uhlopfif-
.. ro jelezo jet[111] - 2,482 A.
Hi poluvin~
ky je u pr ostorov6 centrovan6 mfiiky rovna H 1
Pro # ,,,cl plats nAr
ttuvml 4n
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7.1 ONO,
M'
Liftratura
[1] Vnim F.: FysikMnf v6stnik -* (1964), ea. 2, 13.
[2] GLocKzB R., KAupp E.: Zis. f. Phys. 24 (1924), 121.
[3] ELzxBAAs W.: Za. f. Phys. 76 (19321, 829.
[4] BzzcK 0.: Rev. Mod. Phys. 17 (1945), 61.
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