JPRS ID: 8267 TRANSLATIONS ON USSR SCIENCE AND TECHNOLOGY PHYSICAL SCIENCES AND TECHNOLOGY

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• Collection: JPRS
• Document Number (FOIA) /ESDN (CREST): CIA-RDP82-00850R000100020012-5
• Release Decision: RIF
• Original Classification: U
• Document Page Count: 57
• Document Creation Date: November 1, 2016
• Sequence Number: 12
• Content Type: REPORTS

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~ ~ . ~ .
6~FEBRUARY i979 CFOUO 8179~ i OF i

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~ JPRS L/82G7 ~
; 6 F'ebruary 1979
~
TRANSLATIONS ON USSR SCIENCE AND TECHNOLOGY
PHYSICAL SCIENCES AND TECHNOLOGY
(FOUO 8/i9)
U. S. JQINT PUBLICATIONS RESEARCH SER~'3CE
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NOTL
.1PR5 publicatton~ conr~nin inCormation primarily ttom forcigi;
_ ?lewspaper~, pcriodicals hnd boolcs, buC ~~lso from news agcncy
tra~lsmissions and broadcasre. M~Cerials from foreign-lan~u~~ge
sources ~~re tr~7nslseed; those from Cnglish-l~,ngu~ge sources .
are transcribed or reprinted, with ehc original phr~hsing ~nnd
other ch~racteristics rekaitted.
Headlines, editori~il repores, and m~htierial enclosed in br~ckets
are suppl icd by JE'It5. processing indicarors such ~~ts [Text j ~
or [LxcerpC] in thc first linc of e~ch iCem, or iollowing thc
last line of ~i brief-, indicate how Che original informaCion was =
processed. Wl~ere no processing indicator is given, the infor-
m~ition ~o~ns summarized or extracted.
- Unfamiliar names rendcred plionetically or transliterated ttre
enclosed in parentheses. Words or names preceded by a ques- -
tion mark and enclosed in parentheses w~re not clear in the
original but have been supplied as apprrpriatz in context. ~
Other unattributed parenthetical notes within the body of an
item originatc witti tlie source. Times within ieems are as
- given by source.
' 'I'he contents ot this publication in no way represent the poli-
cies, views or attitudes of the U.S. Government. _
- COPYRIG~IT LAWS AND REGULATIONS GOVERNING OWNERSHIP OF
~it1TERIr1LS REPRODUCED HEREIN REQUIRE TEIAT DISSEMINATION
OF TF{IS PUBLICATION 8E RESTRICTED FOR OFFICIAL USE OI~TI.Y.
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UIEfLIOGRAPNIC DATA ~t~'C"~~ JP[t5 L/ 8267 ne~ipicnt's ACCt991U11 No, -
SHEET
A. ~ 11 ~1' ,Illi~ 111~~~ II ~1� C410fI 11f!
TItANSLATiUN5 0?~ USSEt SCICNCE: ANU 'r~CNNOLOGY - pHYSICAI, 6 February 1979 .
- SCIENCL:5 ANU TECltNOLOCY ,(FOUO 8/79) 6.
Auchurf~l 8. Pcr(orminR Organizution Rept. -
No.
V. I~rrl~urnin~; ~hh~inir.auon Name ~~nJ A~d'l'49 10, Ntoject/Tosk/Wutk Unit Nu~
' Joint Publinatione Reaegrch Service
1000 North Clebe Road 11. Contract/Grant No.
Arlington, Virginia 22201
12, Sronruring Vrganization Neme and Address 13~ Type of Repoct dc Petiod
Covcted
As ebove m
t
15, s~rri~m~~nt,vy Notcs
16. Al~~i~;~ctv
The report contains informaCion on aeronautics; astronomy and astrophy~ics;
atmospheric sciences; chemistry; earth sciences and oceanography; electronics -
and electrical engineering; energy conversion; maCerial3; mathematical ~
sciences; cybernetics, computers; mechanical, industrial, civil, and marine
engineering; methods and equipment; missile tect~nology; navigation,
commuqications, detection,and countermeasures, nuclear science and technology;
ordnance; physics; propulsion and fuels; space technology; and scientists ,
and scientific organization in the physical sciences.
17. K~�~� ubrda and Document Analyeis. 17a. Uc~criptors
USSR Electronics Missile Technology
Aeronautics Electrical ~ngineering Nav:oation and
Astronomy Energy Conversion Communications
Astrophysics MaCerials Detection and
A[mospheric Sciences Mathematics Countermeasures
Chemistry Mechanical Engineering Nuclear Science and
Computers Civil Engineering Technology .
Cybernetics Industrial Engineering O:dnance
Earth 5ciences Marina Engineering Physics
Oceanography Methods Propulsion and Fuels
176. l~Jcnu(n�rc'Upcn-knded Tetms Equipment Space Tecfinology
17c� (.11~A1'I (~irlJ/(:~o~~ 01,03,04,01,08,09,10,11,12,13,14,16,17,~8,19,20,21,22
18. r1.r~l~biliry ~rrtcmrne 19. Security Class (This 21. no. o( Pages `
R~~,a� ~ 5 3
For OEEictal tise Only. Limited ~ `
Number of Copies Available From JPRS � P~a
litude nf the incident wave (which is
n~a~+umE~~l tc~ equc~l o~~e). ~torcovcr~ lf n` Y1 . then the "elcctric" portion of
t li~~ ~i~~riri t cy c~f. tl~c~ ~~n~~r~y ~C excited yur.C~-~re w~~vr~ w:l.lt be comparabl~ C~ or
~;rr;~t~~r than tlie cleitsity oC che entire c~ner~;y in the itt~i.dent ~coust!c w~.,e.
't'lilti mr~~ny that Ii~tera~tion d~ qurfnce wnves witti drifeing electrons tn Che
_ ~~d~~~r.~~iir. gem[conducror c.m result i.n con~iderable (withouC minot~ parameCer n)
~~l ter,~tion nf tl~e amplitudc of the reflected wave.
IRI
4-
J ~
~ ,1
~5 4
1 4 3
. 1
0 ~
l 1,0010 Q/K
Ft~;ure 2. ~ependence of Modulus of Reflection Coefficient on Frequency
of the Incident Wave, 1-4: y2 a 0.04; 1--y = vd/v = 0; -
2--y ~ 1.0; 3--y = 1.2; 4--y = 2.0; 5--~ = 0.01, Y2 ~~.04,
y = i.2
- 't'he c~timate in [1?] confirms these qualitative notions. For the reflectior.
~�~~~~f(ir(~~nt the fc~llowing expression is generally obtained:
i+i ( Y ~ k ~
~2 + r
;~,-a�~ ~ i~ 1 x x'-a` �Q_ l z~~ x,
~r Q
Y = k 1~ '
' i-t -'r .
) : ,
2 ;~~_b~.~~Q_ \ 2/ x, xti--6' ~~Q_ 1 x,
\ 1
(7)
_
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I~~)It ~~I~I~I(;1,1t, It;;l: (~Nt,S'
wli~~ r~~
(~i
i'.n=~~~li~~~;` ~ia; ~(h~..__--Tl_ _~~Ai~i' E~y1"=L'.a,y~U)'-�Il~)l>d~~
- l~f~~~ e,-? e,~
Curves re~~rese?~Cin~; thE~ depenclence of. IR~ on the len~,t:}~ of thc in~..lden~ wave
- .~ucl ~,~i ti~E~ ~?�ift vc~.lor_Ity ~tre shown in t'i~g 2 ai~~ J. 1'he rff.ective dielecCx'ic
r~~ii5tant c~f thc~ ;~~~mlci~tiducrur was takeit tit the t`ollowln~ form:
E�m(~,Q)~~�~n( 1 - t 1
\ ~(UTM / ~
:
~R~(~
I
Y
_ L~ ~
J
1-
~ 3
~ -~4 i .
`
~
- ___1_~~~_.L~_- 1 _J
03 ~0 IS 1Id~US
i~ i~;urf~ 3. D~pendenre of Moclulus of Reflection Coefficient on Velocity
uf F.lectron Drtft: r~ = YZ = p.04; 1---x = Q/k = 1.0005; 2--
x~ 1.0008; 3--:c = 1.00C~y; 4--x - 1.0010; 5~--x = 1.0020
tle~re it w;i~ assu~:rd that tlie dielt:ctric constants of the piezodielectric, el ,
:uu1 ch~~ semiconductor, e~ are identical: E- el ; it was also assumed
ct~.~t ~.~~~m = 1~ where ~i = vtQ is the freq~iency at whic}i th~ length of tne
h~~~i;~ ~;1~�~.~r wr~vc� i5 equal ~o the Sp~1C~.i1F, of thc strUCttcre.
fh~~ ~~tirsct.~n ol th~~ possibi.lity of gencration of waves :n this structure re-
rjtt i 1�t'r; fitt't h~�r ;:tudy. ~
h'(1K UF'f't(;TAi, USE OhLY
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I
1~U12 O!~l~it;1AL U5L ONi,Y
I~ln~~lly, let u~ glve numer.t~~~~l egtim~ttev oC Che dimensions Che structure. -
5n, wtth ~h Erequenr.y of f= 500 Mflx , n= Y2 = 0.04 , and ~ _~~105 cm/a ,
the 1~1t~ice qn8C~i1~, qhnuld bc Q= 6 tii , and itg length must cons3,dernbty -
r.xreed i,~ = 1.5 r_m .
4. Itry~~n.int 'i'r:~i~~miyslon o� an Ar_ouwtir. Wave 'Through a Slit ~etween I'iezo-
c~lertt�tc: Cryyt~tl~ _
l,et piezoel~c~ric cry;~t~~?1 with a periadic~lly perturbed boundgry occupy the
region oE y�: 0. A~ be�ore, let us assume that the piezoelectriC crygtal
bc~l~~ti~s to ~~lass C ~nd it~ hexagonal axis is in line with Oz. If in the _
v
rt~Fton of y> 0 s placed the yame piezoelectric cryst~l with identical
i~E~rtiirbations of its :~urf~ce, then the surEace electroacoustic shear waves
~~rif,inattn~ on ~ccount of unevenness of the lower surface (from which a body
wave i5 reflected) ~,?.L11 ~enerate surE~ce weves on the upper gurface, which,
bf~i~~~ ~rattc~red ir~ turn ~~t uttevennessey, will produce a body wave moving
~11ui~; the n~rm~l to plane y- 0. Ultimately the incident body ~COUJt~C -
wavt, .~t lenst in part, will pa~~ through the slit in the piezo~lectric crystal.
W1~t~n n~-~'' , as demonstrated by the estimate in (1~J, Chis passage cnn be
tc~t~~l. 1'hE~ ~~hwolur_e vxlue uE the trangmi;~siott coefficient is given by Che
~'~~ur~Llon:
1
i ~l Y' ~
ITI~ ~
t x Y'--i
~:_Y~ ~ ~ _ '
y{~~-~--- 2---yy~~ - !i-~ -1-~_.'~l~=~
Q 2
~9)
it i:; possible [o demonstrate that the two transmission peaks when n> Y2
(t~iR 4) correspond to the excitation of symmetric and antisymmeCric slit
mu~les (19~. The width of the transmission curves is on the order oE:
0~ x,
ac ~ s,
c~ k
tmi l~ir t ran:;mission ef fect can take place when the surfaces of the a piezo-
c~i~r~-tric crystal are covered in r~ddition hy elastie layers of thickness h.
_ I~~ this ~~ge t~i the system are resonantly excited Lo;~e waves, and the tWo
- ~rrn~smission peaks (fip S) occurring when a= ne'2Qh/Y~ cos k2h> 1 corres-
~~ond co the excita[lon of symmetric and antisymmetric raodes. The wave trans-
mts:st~n r~ie~ffic[ent is ~iven by the equation in (20j:
10
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~~,~i ~~rrrctni, ~r~;~; urrt,v
! t~c,C,--R,C: cq k,li-~1 c--> tk,r,--~;,c, t~ lc,r-c1 c-~~)
, T~ 2~(It~C~~l-/tzC~=1!; li~r-I�ra ih,C~-hk1Ci t~! k!~-hC1(-}-)
wlie rc~ -
n _ i _ _ _ (,?~0~,~9~~ .
. .L c~~ [9~ -4- il) Z ~l (1 _F- c-zQh) Q~ Csx? tg xl h -
ln these expre9stans ~o i~ the wnve frequency; C1 and C2 ~re Che r~heur
niodull c~f the pler.o~lertric crystal and materi~l of ehe lnyers; kl and k2
~~~ ~~nr1 V, V. :';;mlr. fia.y N~~utron Componant ~
l, tr~tr~.~i~~ctic>t~ ~ ~
'..j1cl11aLion::, ~,f b.~~~r,~etric cooff'icient using the methods
- o�' ~a i rc~d and tr. ip1H corro lations ~
'1. !~'~.~+;thAws mo thod ~ =
li, Mc~thod ~f ~artial barometric coafficient 3?
A) ph,~-pro~ram and instruction for its running ~ -
I;xamplFS o;' calculatio�s of barometric coefficient an the
b~sis o~' thQ d~ta from the xorldxide netxork nf st~tions 42 -
Ch~~~,ter Analysis of Latitude Effects in Cosm.+_c Rays ,4L~
t . Introduction -
- 2. InsQrt,ion of correcttons for ~lobal cosmic ray variations in ~
the data of latiti~dQ expeditions 46
N;ethod for obtaining the coupling coefficients on the basis
t.r~n ~jata ~n th~ gaomagnetic ~affects in cosmic rays 1~?
Al~~h1-~~ro~;rams an~3 instructions for their running 51
- I~'.x~m~~lci;; of com~ut~r-analyzing the data of latitude expeditions 56
Ct~1E,tr,r t~ i.nciing of
I'eri~dicities in Cosmic Ray Variatinns (
t . In4.r�nd~.ict i~n 63
"c~1c~Ctlvc3 ~pectral ostimates 63
DiKit-i'1ltration of data 65
Crlt~rion :or verification of time series stationariness 7
`i. AiE,t,a-~~ra~rams and instructions for their running ~
f,, F~;xam~~l.es of findinp of ~eriodicitie5 "
89
Ch:~~t.er 5. Unifi~d Analysis of Cosmic Ray Variations xith Some
Ceo- ar,d }{Qliophysical Factors ~
1. Int.rc~uctinn
9~+
21E
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i~'nit n~~ ~ c~ ii:;i ~~~~~.t�
:;~,i~a~~t,tv~? mut,;;i.l. r;~~r.~tt.r;~ ~~1' ~,nW,?r.
~ `i
. ~ i r c ~ -
114 ~~,ti-E;rof,r>~.lity control of the oper~.tion of
c~nsmir ray st.~.tions, thci ~~t ~f stations ~.nd approximation of the observation
r~~�r,~.~lt.s uitti the h~lp of' ~lem~nt.ary funetion~, Quality control of ttie itork
~~f ~:;~~~,~,r~tely taken ,tation ~f cosm!.~ r.ay; is con~iucted xith the help of .a
t.~~~hr~i~~u~~ h~7~A,:i nn ana].ysi:; ot' the ~utput, data of thrQa channels of single-
t.y~~� r,hv;;tcal in,'orm~.tion, iier.A thc~ ra~;ul~r component.s are ~xelud~d and a
,)~irif, ;~nrilv:;i:: is ma~jf~ ~f flu~tu~.ti~r~:; ~n thQ rQCOrdit~s of inflividual
cli:3tlt1(~1;;~ 'I'l~c~ ;:t.~ti:;t,lr.a1 ch~ract~risties of noiso in the case of a ma1-
f~~n~~t,to~~ in t.he oE~c?ratl~r~ of the channQl are changod. The method makes it
~~~+:-r ih]e t~~ f it,d m.~lfnnr.t,ions in the running of individual channels, reveals
}hf~ m~~]f'>>tict.i~~n intr.rv;~l., ~Lnd p~rmits ins^rtior_ of a correction into the
cir~t,r~ ('or time ~,f' t,hE� malf'unr,t.ion. In that form that the method is stated
t~~~rc~ it c~~r, t~~ usf~~l for quality control ovQr the operation of ~ny geophysical
i nst r~~r~~t~t, tl~at. ha; t.hre~~ ~nd norA channels of single-type physic~.l infor-
~