JPRS ID: 8415 TRANSLATIONS ON USSR SCIENCES AND TECHNOLOGY PHYSICAL SCIENCES AND TECHNOLOGY

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CIA-RDP82-00850R000100040051-0
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RIF
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U
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73
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November 1, 2016
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51
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APPROVE~ FOR RELEASE: 2007/02/09: CIA-R~P82-OOSSORO00'1 0004005'1 -O r~ ~ . Z3 APRIL i9T9 . ~CFOUO ~3179) ~ `i OF i APPROVED FOR RELEASE: 2007/02/09: CIA-RDP82-00850R000100040051-0 APPROVED FOR RELEASE: 2007/02149: CIA-RDP82-44850R000100044451-4 FOR OFFICIAL USE ONLY JPRS r:/eais - a3 Apr3Z Z9~9 ~ r TRANSLATIONS ON USSR SCIENCE AND TECHNOLOGY ~ - PHYSICAL SCIENCES AND TECHNOL~GY (FOUO 23/79) U. S. JOINT PUBLICATI~NS RESEARCH SEt~VICE ~ FOR OFFICIAL USE ONLY APPROVED FOR RELEASE: 2007/02/09: CIA-RDP82-00850R000100040051-0 APPROVED FOR RELEASE: 2007/02149: CIA-RDP82-44850R000100044451-4 - NOT~ , JI'ItS publications cunrain informarion primarily from foreign newspttpers, periodicals and books, buC also from news ggettcy Cransmissians and brandcasts. Materials from foreign-language sources arc translated; thoae from English-language sources are Cranscribed or reprinted, with the original phrdsing gnd other characteristi~s reCained, Fleadlines, ediCorial reports, and maCerial enclosed in brackeCs ~ are supplied by JPRS. Processing indicators such as [Text~ or [~xcerpt] in the firsC line of each iCem, or following the lasC line of a brief, indicate t.ow the original informaCion was processed. Where no processing indicator is given, the infor- mation was summarized or extracted. Unfamiliar names rendered phonetically or transliteraCed are enclosed in parentheses. Words or names preceded by a ques- tion mark ~tnd enclosed in parentheses were not clear in the orig?nal but have been supplied asappropriate in contexC. Other unattributed parentheCical notes within Che body of an _ item originate with the source. Times within items-are as given by source. The contents of this publication in no way represent the poli- cies, views or attitudes of the U.S. Government. COPYRIGHT LAWS AND REGULATIONS GOVERNING OWNERSHIP OF MATERIALS REPRODUCED HEREIN REQUIRE THAT DISSEMrNATION _ OF THIS PUBLICATION BE RESTRICTED FOR OFFICIAL USE ONLY. APPROVED FOR RELEASE: 2007/02/09: CIA-RDP82-00850R000100040051-0 APPROVED FOR RELEASE: 2007/02149: CIA-RDP82-44850R000100044451-4 FOR OE'FICIAL USE ONLX JPRS L/8415 23 April 1979 TRANSLATIONS ON USSR SCIENCE AND TECHNOLOGY _ PNYS I CAL SC I ENCES APLJ. TECHNOLOGY (FOUO 23/79) CONTENTS PAGE ~rsres _ The Influence of Optical 8yetem Abe:ratior~s on the Ma,in Psrameters of a Thermal Scanning Viewer (B. V. Ukhov, et al; OPrIKO-N~QiARIC~'sSKAYA . ~"[~Vl'i1~LL.1Gir,\~Si ~ ~ 1\0 l~~ ~97v, � ~ ~ ~ ~ ~ ~ s ~ ~ ~ ~ ~ ~ ~ ~ ~ ~ ~ ~ ~ ~ 0 1, An Analysis of the MBtrN.ogical Capability of a Coherent Optical Method of Monitoring the Shape of Complex Surfaces - (V. A. Kudrye~yteev, V. 3. Shapov; OPTIKO- MEI~ANIC~sKAYA PROMYSffi~ENNOST~, No 11, 1978) ~ 7 Results and Develop~nental Prospecta in Optical Ceramica (F. K. Volynets; OPrII{0_~~~,ggqyp ~ PRO~lYSffi~Il~10ST~, Ro 11, 1978) 14 The Basic Principles of the Automation of the Process oP Shaping Astronomice~l. Ogtics (A. M. Prokhorov, et al.; OPTIKp_MEHIiANIC~~py,A PROI~sffi~ENNOST~, No 11, 1978) 22 The Selection oP the CuuditiQna Por the Machi;ning of - Large Ogtical Components (A. P. Bogdanov, et a1.; OPTII{0-MEI~'ArTIC~3KAyp ~tol~s~xxOSr~, No ~1., ~9?8) 30 Cast Componente of Sugerinvar for Optical Instruments . (3. V. Rabinovich, ~t a~.; OPTIKO-MEKHA,NIC~SKpyp PROI~fS~ENN06T', No 11, 1978) 38 The Statistical Characteristics of Opticsl Radiation Attenuation in the Ground Le~yer of the Atmoephere (Sp~ing, Autumn) . (V. L. Filippov, et al.; OPTIKO-N~IG'~gKAyp PROI~sffi,~1NOST~, No 11, 1q78) 43 - a- [III - USSR - 23 S& T FOVOJ FOR OFFICIAL USE ONLY F. , APPROVED FOR RELEASE: 2007/02/09: CIA-RDP82-00850R000100040051-0 APPROVED FOR RELEASE: 2007/02149: CIA-RDP82-44850R000100044451-4 FOR OFFICIAL USE ONLY ` CONTENTS ( Continued) ~ p~,ge - A F1~a~ Sca.nniug Viewer P~r Quality Control. in the 4 Asgembly oP ~he Stators of E1.ectrical Nkchinea (M. M. Miroehnikov, et a1..; OPTIKO- _ N~ADiIC~SKAYA PftOMStSffi~ENNOST' , No ~l, 1978) 50 PUBLICATZ(~18 - Transfer oP Electron-ExcitQtion B~ergy in Condensed N1~di8 ~ (V. M. Agranovi~ch, M. D. Ge~l.anin; PII3ENOS - n~~ii ~aoNrroao vozBt~z~nQnca v KoxnnQSnzoVANrr~ s~, i978) 54 -b- FOR OFFICIAL USE ONLY = APPROVED FOR RELEASE: 2007/02/09: CIA-RDP82-00850R000100040051-0 APPROVED FOR RELEASE: 2007/02149: CIA-RDP82-44850R000100044451-4 ~OR OFFICIAL USE ONLX PIiYSTC?"~ . UDC 621.384.326 THE INFLUENCE dF OPTICAL SYSTEM ABERRATIONS ON THE MAIN PARAMETERS OF A THERMAL SCANNING VIEWER Leningrad OPTIKO-MEKHANICHESKAYA PROMYSHLENNOST' in P.uasian No 11, 1978 ~ pp 3-5 [Article by B.V. Ukhov, V.G. Klochkova, D.N. Krasnikov and S.M. Benza, manuscript received 16 Nov 77] - (Text] Queatiana related to the influence of the aberratione of the optical systE:m of a thermal vieWer on the angular resolving power and the signal to noise ratio are treaCed. Quantitative resulta are derived for various valuea of the - time constant of the photodetector. We shall assume that the thermal viewer observes an ob~ect which takes the form of two infin~.tely long etrips, perpendicular to the direction of the line scanning. The width of these stripa and the spacing between them cor- responds to the instantaneous viewing angle of the thenaal viewer, which we shall aesume to be equal with respect to the line and frame. Let the x - axis coincide with the direction of the line by line scanning, while the y axis corresponds to the frame scanning direction. We shall attempt to take into account the influence of the dimensions of the effective circle of con- fusion of the optical syatem on the .waveform of the amplifier output signal and the basic parameters of the equipment. In a real optical system, aberrationa and diffraction scattering ~1] wash out the images, where this blurring can be characterized by a scattering _ function h(x, y, x', y'). According to the literature [1], the dietribution of the irradiance E(x, y) in the image plane of the optical syatem for the - case of an irradiance E1(x', y') in the ob~ective field is determined by meana of the convolution integral: ~ ~ e~x, y~ - j j F~ c~'~ h(x. y, x'. y'~ dM~. We shall approximate the scattering function with the gausaian function, some- thing which is ~u~stified with a sufficient degree of precieion for many actual optical aystems: ~ (X� r� y~) ' 2s ~ . i' (cX-.~'r~ tr -y'rl � . 1 ~ntt nr~*~T ~ T ncu n~n v APPROVED FOR RELEASE: 2007/02/09: CIA-RDP82-00850R000100040051-0 APPROVED FOR RELEASE: 2007/02149: CIA-RDP82-44850R000100044451-4 FOR O~FICIAL USE ONLY ' _ In Chis case, the distribuCion of ehe irradiance, corret~n~~nding to the ob~ect - in the farm of one strtp, wi11 be defined by the expreseion: E(x,Y) Y: B u~1 Q- ~''t(.r-x~1~~Ffy-y'?~I Zs f f X ~ - _ _o~ Xdt'd,r~~-~I~~elY~x? 2)~~~~i f �~~,r~ l/~~' - ~ I i e~ (s) ' ~ " `e~ ~ da - - where ~(z) a 1~~~ o is the probability inCegral; B is a conatant; a ia the size of the area of the photodetector. The sensiCive element of the photodetector observes the image by virCue of moving the latter along the x axis. This means the change in the irradiance - of the receiver area E(x, t) with respect to time has the form [1]: E(x,!)..~(x-ut)~'~~~D f Y(x-vt-~- 1~1_ L 1 .l IT(x-vt- 2)J~, ~ where v is the rate of travel of the image with respect to the r~ceiver area. The signal level at the output of an inertialess photodetector with uniform , sensitivity E over the area is: _ o a 3 3 r -