SCIENTIFIC ABSTRACT V.A. DERSAKYAN - A.K. DERTEV

• Document Type: CREST
• Collection: Scientific Abstracts
• Document Number (FOIA) /ESDN (CREST): CIA-RDP86-00513R000310220001-2
• Release Decision: RIF
• Original Classification: S
• Document Page Count: 100
• Document Creation Date: January 3, 2017
• Document Release Date: July 27, 2000
• Sequence Number: 1
• Publication Date: December 31, 1967
• Content Type: SCIENTIFIC ABSTRACT

DIRSAKYAN, V.A., inzh.
Resistance welding of pins
no.10:33-34 0 157.
(Ilectric
to transformer covers. Svar. proizv.
(Kru 11: 1)
transformerv--Welding)

_DE~SAWS
21202
(Iol;~o, /139pQ) H/012/60/008/006/001/002
B122/B227
AUTHORS: Drashev, M., DerZ.0ans'ki, A., and Betov, B., Members of the
Institute (se Uoclation)
TITLE: Electronically stabilized voltage source (0-2500 v, 40 ma)
of high stability and low internal resistance
PERIODICAL: Me'r'es e/s Automatika, v. 8, no. 6, 196o, 179-182
TEXT; The direct-voltage source described is electronically stabilized,
its output voltage is of high stability and adjustable within wide limits
0-2500 v), and it supplies a current of relatively high intensity
0-40 ma). The referen'ce voltage source is also electronically stabilized.
~
The stabilization factor is higher than 1000 Tithin the entire working
range, and the internal resistance of the voltage source is about 1 ohm.
When the loading current has reached a certain value, the output voltage
is automatically switched off. Voltage sources meeting these specifica-
tions are needed for research on the discharge characteristics of various
gases, where the phenomena in question appear within very narrow voltage
ranges. A series-regulated stabilizer is used for the required current

21202
Electronically stabilized voltage ... H/012/60/008/006/001/002
B122/B227
intensity, and an auxiliary source is necessary for the reference voltage
because of the wide range of output voltages. The auxiliary voltage
source is also electronically stabilized because it has to supply a
sufficiently high negative voltage for cutting off the series regulating
tubes. Fig. 1 is a block diagram of the stabilized voltage source.
Because of the limited load capacity of eieries tubes, the entire output
range is divided into two voltage ranges: 0-1000 v and 1000-2500 v. In
the first range, the voltage of the rectifier unit is about 2600 v, and in
the second about 4600 v. Prom known formulas for series stabilizers
regulated on the output side, the following values are computed: amplifica-
tion of the regulating amplifier: 3360. This can be attained easily by a
two-stage amplifier. Output resistor of the supply unit: 0.5 ohm. For
the reference-.voltage source, a stabilization factor of 10,000 is assumed.
As the regulating amplifier of the voltage stabilizer is supplied from the
reference voltage source, a low internal reaistance of the latter is
desirable. Therefore, a series-type circuit is expedient here, too. To
avoid dependence on filament supply, part of the tubes of the regulatipg
amplifier are heated bf an electromagnetic stabilizer which also supplies
the a-.a input of the reference source. The necessary stabilization factor

Electronically stabilized voltage ... H/O 1 il~?6002/008/00 6100*1 /002
B122/B227
of the direct-voltage stabilizer part is calculated to be: 500. The
amplification of the two-stage amplifier of the direct-voltage stabilizer
of the reference source'is about 1000. The output resistor of the
reference source is rated at 1 ohm. The mains transformer supplies an
effective voltage of 1600 or 3200 v according to the settinp of the output
voltage. The reference source is supplied by a transformer which receives
pre-stabilized voltage from a mains transformer. A relay included in the
stabilizer assures that, when the load reaches a certain value, negative
voltaCe is switched on the tube grids, and the output voltage is reduced
to zero. Characteristic curves are presented in Figs. 3-6. There are 6
f igures.
ASSOCIATION: A Bulga'r Tudoma'nyos Akademia Fizikai Inteiete (Physical
Institute of the Bulgarian Academy of Sciences)
SUBMITTED: January 14, 1960
Card 3/6

Electronically stabilized voltage ...
21202-
H/012/60/008/006/001/002
Vol tage- Fig. 1
regulating
tube
RS 2)7
+
Rectifier Regulbting', amplifier
unit r
-T-11r- 3b70 6
250/. T Potentiometers
r6cti~fier regulating
tube's Output.voltage
Amplifier
~91; ~,,c ~fi I a- 4r-
Re-etif 6H9C -
3!2k C
1tilbes
6H7 series-regulating
tube
Card 4/6

21202
Electronically stabilized voltage ... H/01 60~008/006/001/002
B122~~22.
Characteristic curve8
'0708v Fig. 3
01-12 T 60 v
Fig.4
190 220 240 v
0
Variation of output voltage versus
mains voltage at 1500 v output
40 Y
Variation of output voltage
verous loading ourront
Card 5/6

Electronically stabilized voltage ...
1 5
50 my
O'~;
3 0 Mir
1000 1500 2000 2500 V
voltage versus
Variation of ripple
output voltage (between 1000-2500 V)
Card 616
21202
H/012/60/006/006/001/002
B122/B227
4J
:3 CH
0 Cd
A
ho
CO
4-% r=
H 44
0 JO
4J
to
0 W
0 r= #(I
.r4 4j W
4J 4-1
EA LO :S
La .CY 0
0 53
G 0 0
CO
0 $3
T4 V4
4J A
10- co 0
-- -ri 4J
14 -H
CO x

DFR-SHVARTS, G. V.
r
Cand. 'Technical Sci.
"Oalculation of High-lProquency Ourront Supply Lines." Sub 28 7eb 47,
Moscow Order of -Lenin Power Sngineering Inst imeni V. M. Molotov
Dissertations presented for degrees in science and engineering in Moscow
in 1947
SO- Sum No- 457, 18 Apr 55

DER-SHVARTS, 0. V,
."Representing the Skin Effect in System of Right-Angle Bus Bars," Zhur. ",'ekh.
Fiz. , 18, No 11, 19,47 -

DER-MAROS, G. V-
PA 221/469T16
Oct 48
ElectrIcal Equipment
Testing and StimAardlyatim
"C nt on D. B. Mondruo, S. X. Mirgolln;
and V. M. Zillberman's Article, 'Standard4za-
tion ofligb-Frequenov Equilment,'" G. V. Der-
Mf*arta,, Card Tech Soi, Moscov Pcmer Ing Inst
Imeni Mo-lotov, M. Ta. Smelyanskly, lln~,
Tmentroprmalektropeeb M, 3/4
lTl&ktrlchemtvo" No 10
States v*iev7g on subject (See 691127).
22A 6

DER-MVARTS) t3. V. 18/49T104
Currents, Electric - Measurements Nov h8
Nis Bare
"Reprewenting the Skin Effect In System of Right-
Angle Bus Bare," 0. V. Der-Shvarts, Moscow Power
Eng Inst imeni V. M. Molotov, 11 pp
"Zhur Tekh 7iz" Vol M11P NO 11
Deteimtines ratio of variable resistance due to
frequency to static resistance at zero frequency for
one of the right-angle bus bars in an endless, charge
packet on basis of distribution of current density
in,an Ideal conductor. Sitlaittel 7 Oct 47.
18/4,gTlch

DMZVARTS., 0. V.
"Industrial Electric Furnaces," 1949

DERUDIARTS, G. V.
:DOC
Inthidtion Heating
"Dynmic Forces in the Melts Of Induction Fur-
nace';," G. V. Deiehvarta, Cand Tech Sci, Moscow
-Power Eng Inst imeni Molotov
nElektriches,.-vo" No 12, PrP 33-36
Mixing forces in'inductio-d furnaces dependr: on
the'form of the f1d. 11xisting-formulas tb det,
pressure due to the pi:ach effect are extended
for the case of ac. Submitted 9 Jim 50.

DERSHVARTS, a. V.
109R/Electricity - Furnaces, Electric Oct 51
Modeling
'Tlectrod~mamic Modeling of Electric: Heating
Equipments," G. V. Dershvarls, Cand Tech Sci,
Docent M. Ya. Smelyanskiy, "Tsentropromelek-
tropech"
"Elektrichestvo" No 10, pp 47-51
Discusses the principles of electrodynamic
modeling as applied to the design of elec heat-
ing equipments, particularly induction furnaces
and current feeders. SubmItted 23 Idar 51.
20IT44

G. V.
USSR/Physics Electron Microscope FD-573
Card 1/1 Pub. 153-.'3/28
Author Der-Shvarts, G V.
Title Influence exerted by the disruption of rotator symmetry of the focussing
field upon the resolution of magnetic objectives in electron microscopes
Periodical Zhur. tekh. fiz. 24, 859-87o, May 1954
Abstract E=loys an idealized model of the mWetic objective to study the
influence of small asymmetrical disti.trbances in the focussing field
upon the resolving power. The niunerical computations in the present
work were conducted in the Moscow Pover Engineering Institute imeni
V. M. Molotov by computers iuader the direction of docent L. Z. Rumshiskiy
Institution
Submitted August 23, 1953

,R.~;HVARTS, G. V.
DF
Institute of Electronic Optics Of the State Cormittee for Radio Electronics, Moscow.
"A Combination Intergration Device for an Exact Calculation of the Fields of
an Electron-Optical Photographic System."
report presented at 4th Intl. Conference on Electron Microscopy, Berlin GFR,
10 - 17 Sep 2-958.

AUTHOR: Der-Shvarts, G.V. 109-3-2-14/26
TITLE: Network Integrators Having an Ineweased Accuracy for the
Calculation of the Fields in Electron Optical systems
(Setochnyye integratory pov3rshennoy tochnosti dlya rascheta
poley elektromaoo-Dticheskikh sistem)
PERIODICAL: Radiotekhnika i Elektronika, 1.958, Vol.III, No.21
pp. 262-266 (USSR).
ABSTRACT: Calculation of two-dimensional symmetrical fields is
based on the integration of the Laplace equation:
2 21 (P = 0
A J(P D~ + Dz
This can accurately be approximated by:
K R, (3)
6h
where the tunction K[(pl is given by Fq.(2) and the
term R, is expressed by Eq.(4). Fron.the above, it is 8een
th t the error term R is proportional to the sixth power of
Card ~73 1

109 ;K 2-14/26
-6e Calculation
Betwork Integrators Having an Increased Aecuracy for U
of the Fields in Electroi~ Opt:jcaj Systems
of the grid-spacing parameter h The operator expressed by
Eq.(2) can therefore be used as the basis for the construction
of an accurate analogue, suitable for the integration of
Eq.(I). The problem of finding a suitably accurate operator
for the integration of the Laplace equation in a cylindrical
co-ordinate system, as expressed by:
2 1
Dr + - Dr + D? ] T (5)
2T ~ I r z
presents certain difficulties. It is shown, however, that-
if (p is defined by Eq.(6), 62(P can be expressed by Eq.(9)
and its component Dr(P by Eq.(10). 3q.(9) can be solved
with respect to To and it is shown that (PO,n is given by
Eq.(12), where A(n) , B(n) and S(n) are defined by Eq.(13).
Eq.(12) can be transformed into Eq.(14). It is shown that the
operator of Eq.(2) can be represented by 8 resistances
connected in a star (see rig.3);. the conductance of the
Card2/3 diagonal elements of the star is four times lower than those

109-3-2-14/26
Petwork Integrators Having an Increased Accuracy for the Calculation
of the Fields in tiectroij. Optieffil Systems
of the vertical and horizontal elements. The construction of
an integratin.6 ne-tAvork for 'a2q' is more difficult but it is
possible to determine all the necessary parameters. If the
ne-tAvork is to be sufficiently accurate, Z12T = 0 should be
approximated by means of6a finite difference operator having
an error of the order h gn2,(p can then be expressed by
Eq.(26), in which the various constants are determined by the
equations on p. 266.
There are 3 figures and 3 Russian references.
SUBMITTED: May 10, 195?
AVAILABLE: Library of Congress
Card 3/3 1. Electrons-optical system-Ana-lysis

AUTHOR: 'Der-Shvarts, G.V. SOV/109-3-10-12/12
TITLE: A Th'"M*Mloatic Aberration, Limiting the Resolution
of a Reflex Electron Microscope (Ob odnoy khrQ.-maticheskoy
aberratsii, ogranichivayushchey r,,:izresheniye otrazhatuell-
nogo elektronnogo mikroskopa)
PERIODICAL: Radiotekhnika i Blektronika, 1958, Vol 3, Nr 10,
pp 1315 - 1320 ~USSR)
ABSTRACT: The work deals with the o-Deration of the magnetic lens in
a reflex electron microscope. The pole-piece of a
magnetic objective is shown schematically in Figure 1.
lf the diaphragm, which limits -;he electron beam, is
shifted with respect to the FEI.Xi$ Of syrmptry, the picture
is formed by means of deviateo. electrons. -:The',vector
Dotential in the vicinity of the opticai axis can be
'aescribed, for this case, by the followinE equations
(Ref 2): B(Z)
AX = --f- Y C 0 s
B(Z) B(Z)
Ay = X cos 2 Z sin 3. (1)
B(Z) 13, (Z)
Ca_-dl/3 A2; = -,I- Y sin D -2- YZ sin

SGV110~1'0-3-10-12112-
A.Certain Chromatic Aberration, LinitinE tLe Resolution of n Rcf -11-7-
Electron Microscope
where B(Z) is the distribution of the inductance along the
axis of symmetry and P is the angie betweea the axis
of synn-etry and the optical axis. The equations of the
trajectories in the co-ordLriate systen Xl, Y1 Z -are
in the form, of Eqs.(3), vhere X, Y and. Z are fixed
co-ordinates. In a norimilise6 form, the equations are
written as Eqs.(3a) and(.,'d). Their solutions can be
written as Eqs. (4a) and Since a portion of the
electrons loses some of its energy 'w4en interactinL, -~~.,ith
the object, the tiaJectories of the electrons having
velocities proportional to V77 and ~-yp* - 4T diverge.
Projections of this divergence & and Ay can be
determined from Eqs.(5a) and (5 their solution is
given by Eq.(6). The final solutions of Eqs.(3) and (6)
are.gven by Eqs.(?), (8), (9) and (10). In particular,
Eqs 8) and (10) permit the determination of 6x' and
which determine the scattering patterns in any
required plane. FiGurea, 3a and 36 show the scattering
Card2/3 patterns for a centered beam ~;ihich moves alonG the optical

SOV/100,-3-10-12/12
A.Certain Chromatic Aberration, Limitintr tiae Resolution of a Reflex
Electron Yicroscope
axis z and emerGes from the objects at an angle a
The three photographs fiVen in FiCure 4 illustrate the
above aberrations; Figure 4a shows the microphotoGraph
of a copper etched surface; Figure 46 illustrates the
same samplc for the case when the diaphragm was shifted
b.y 0.04 mm, while Figure 4B corresponds to the diaphragm
shift of 0.07 mm.
There are' 4 figures and 5 references, 4 of which are
Soviet and 1 German.
SUBMITTED: March 6, 10/58
Card 3/3 1. Electron microscopes--Operation
USGONM-DG-60305

AUTHORS:
,DAr=Shv&r4e,-C1,V._,_,Candidat of Teclmical 4,05-58---12/28
Sciences, Netrebenko, K.A. , Engineer (14!osco;v)
TITLE: On the Problem of Calculating Plana-Paralle.' and Axially-SYT.Unetric
Electrostatic Fields (K voprost) o raschete ploskoparallel'ky'k-h I
osesimmetrichn,vkh elektrvstatich~!skikb. poley)
PERIODICAL: Blektricliestvo, 1958, Nr 5, y?. 51-54 (USSR)
ABSTRACT: The possibility of a mom rational nunerical integration of the
Laplace equation for a plane-parallel field (equation (1)) and a
field with rotation symmeti.7 (equation (2)) is investigated. The
first chapter deals with end-differerce operators. lt is shovin
that the "eight-point" opeivaton attain --onsiderable impor+ance.
They have potentials of eight points Joe-ated beside the point of
observation. Good results are ob"-,aired by operatgr (11) , ,vfdah
approximates the equation (1) vith an error of h (Ref 5). Also
for fields with rotation symmetzy, for the purpose of solving
equation (2) eight--poiZt crperatoz-a can be obtained. One of thm,
(12) has an errur vf h (Ref 7). The second chapter deals with the
Card 1/2 structural scheme of F- specla1liz(-.-d compu-.er, which consists of a

On the Problem of Calculating Plane-Paralle.-I 105--58-5-12/28
and Axially-Symmetric Electrostatic Fieldq
lattice integmtor in an automatic measuring device, an arith-
metical device with d-L?.%;rete effect, a control b"Lock, and a
memory. The process of solving the system of linear algebraic
equations of the fom K(y) -_ 0 on this specialized mach-Lne is ai~--
scribed. The arithmetii:,,ai de-o'Lce and the memory can 'b-- manufac-
turea in series. The lattice-in~egmtor manufactured in series is,
however, noi very serviceabl-:!. :For the solution of~ plane-parall':,l
problems it is advisable to -uze a urifom, square lattice conbi-st-
ing of unequal not oc.ntrollable resistances. For the calculation
of fields with rotation symretry the authors constructed a special
lattice integrators which is described in ihis paper. There are
3 figures, and 9 references, 8 of which ar,! Soviet.
SUBNITTED: August 6, 1957
AVAILABLE: Library of Congress
Card 2/2 1. Electrostatic fields--Mathematical analysis 2. Mathematical
computers--Theory 3. Operators (Mathematics)--Applications

J-nva-rts, G, V., Netr2benko, K, A-, 307/119-5e-9 S
Digi tal Compensator Vi th Binary Fnc' I ita- Ica':
~ec r
(Tsifrovoy avtomaticheskiy komDensator s dvoi--hno-
~esyaticbno.., shkalo-')
Priborostroyeniye, 1958, Nr 9, pp. 7-9
'T:
-'33'2HAC Le scale,
The device consists of a potentiometer with P. iiscre'
-

closing ant"- change-ovFr switch for th~ put,-,ntiometer, a
a

prograin ne, -tor coz~trolling
zero indicator, and a rots.ting 'ec.
the performance of all the components of the dL%--ice: As a
pot,entiometter a ocries of re3ist--nces are usei the vaiuea of
which are corr~!spcnding-1,,,.- 10, 10C, and 1000 tinii~s smaller for
the successive iecades. i,e- a binary-d;ecimal ca!e with
wei,-hts 2,4,2,1 is us?d. 1, series of relays form's the
OVL-r switch of the acasuring v:)ltage divider. DiArore vie. be-
ginning of eac . meazarement, n11 rcla:o are corinectel , thc
mc:a:s-irjrg voltnec: 1,clrg z--lro. ThL mL~anwring pfcz2ss
-11111CX111~7 0-
vi i t h P. Y i im P u n c. ae 14 i n t .10 the
b -j
, tne drum of the progra-m sol-a-ctor, the impalse aotuat;nt~
2 tli~ f-.rst relay. 1.2hr, volt,ag,~ r~~-sulting th~.re iz

DipiLall Compensator lith Bjnv.r,,;
Dr- oj[ St;fl: c-l
tn at of -, Zero ind, i-* catcor I, i- with th,) base vcltaz~E)I, an
so meksured. 1n. --u.rtnS,7 CCIl,,..Sz,,,-iL-nc:? the cnata-,ts
the rrc,~,ram connn.---, ',nzi c~--;-csponainf:- r~-Iuyz. TnG
rllicaGurement is L,,, mL,!.sur-Lr4&; the ouui voj.tPv:,-L: from the
relays v.,,.th ~,n ac(;urac- of io-k of the na~-,,~-
1; -r,-Inpr the riumber o--.' C'U!, L-.,
It is
nuirts, the firat nart. ~,)nLaining the autematic comp ~Oa,
n - ,;j:,sa4
anl` thci zecond the t:vpcwri-:-cr. Tne device hac a J-dc!zade
contxoli(~l zeiephona rela,,,,s of tll--- ttypa 104.
monr,3 of th) zo.c-,-) whIch is fed a ;. i r,
Tent V,-;ItLge of a t~(,Ut lcl- V, -E. e.m.l- can bo th
ar accurv y-;-~-writer a s'ardard mo-i~--~ of
-v nf 0~01 L. As a t L, I
tile typ-l- SDLJ is usocc,. TK-~ DA.P-1 type drum of the program
seloctor is conn-z~ctcd to .--t running motor,
There are 5 figurF~3 . an 1 ;14 rlr-f r renc-03, 4 of whi-ch ar2 Su-, ; i2,
"nr,i 2/2

DFF,,~SHVARTS~ G. V. and KUSHNIF, Yu, M,
Institute of Electronic Optics Of the State Committee for Radio-Electronics, Moscow.
"Concerning Some Problems of the Reflection Microscope.'
report presented at 4th Intl. Conference cn Electron Microscopy, Berlin GFR,
10 - 17 Sep 1958.

'_UTHOR: Der-Shyarts '0V/109-59-4-2-27/27
TITLE: Concerning the Article: "Grid Integrators of Increased
Accuracy for the Calculation of the Fields in Electron-
Optical Systems" (Po povodu stat'i ,Setochnyye
integra-tory povyshenno7 toobnosti dlya rascheta poley
e'Lekbronno-opticheskikh sistem")
PERIODICAL:Radioteldmika i Elektronika, 1959, Vol 4. Nr 2,
Pp 347-348 (USSR)
ABSTRACT: The paper under the above title appeared in this journal
in February 1958 pp 262-266. It was stated in the
article that a series of finite-difference expressions
exist which approximate the differential Laplace
equation: 2(, = D2 + r-'Drip = 0 (1)
with an error proportional to the 6th power of the
pitch h of the sq~zare grid. This can be expressed by
Eq (2) where K2 is given by 33q (3). The second term
of Eq (2) represents the main portion of the error of
the approximation. This error is dependent on the
Card 1/2 method of finding the coefficients ak. The expressions

sOv/109-59-4-2-27/27
Concerning the Article: ,Grid Integrators of Increased Accuracy
for the Calculation of the Fields in Electron-Optical Systems,,
for these coefficients gi:ven in the
to comparatively large errors when
error can be substantially reduced
are ewpressed by Eq (4) - (9).
SUBMITTED: 11th November 1958
above paper lead
n is small. The
if the, coefficients
Card 2/2 usw%-Dc-60_,516

sov/iog-4-6-13,127
AUTHORS: Der-Shirarts, G.V. a:nd Kushnir, Yu.M.
TITLE: On the Problem of the Lens Achromatisation and the
Scaling Distortion Correction in Reflex Elec-tron
Microscopy (K voprosu ob akhroniatizatsii linz i korrektsii
masslitabnykh iskazheniy v otrazhatellnoy elehtronnoy
mikroakopii)
PERIODICAL: Radio t eldinilia i elaktronllm, .1959, Vol If, Nr 6,
pp 1002 - 1007 (USSR)
ABSTRACT: The chromatic aberration in a reflex microsc;ope is
comparatively strong and reduces the resolving, power
of the system. However, if the irradiation angle 13
and the observation angle EJ :tr'a small. the resolving
2
power can be increased. The reduction in the angle 0 2
leads to SCalirLg distortions. The problem of eliminating
or reducing the chrotuatic aberration (achromatisation)
was investigated experimentally by employing a microscope,
type EM-100. It was found t-1-.Lat the chromatic aberfation
Cardl/2 could be reduced by increasing the optical power of the

Sov/ioq-4_6-i3g(27'
On the Problem of the Lens Achromatisation and the caling
Distortion Correction in Reflex Electron Microscopy
lens (Ref 5)- In practice this antodnted to reducing the
focal length of the lens. The resulting eahromatisation
incr ases the resolving power of the microsc;*pe to about
600 1. The scaling distortion amn also be paritially
eliminatod by introducing a cylindrical lens into the
coiwan of the microscope. By thip means, the scaling
ratio of about 2 could be-achieved for the observation
0
angles o:f up to 8 . The microscope thus corrected could
be successfully employed in metallographic investigations.
There are 6 figures and 3.1 references, of which 3 are
English, 2 French, 3 German and 3 Soviet.,
SUBMITTED: Marc)!L 17, 1958
Ca,rd 2/2

SOV/109-4-7-8/25
AUTHORS: Bykhovskaya, L.N. and Der-SlIvarts. 'Riy. Electrouic
TITLE: Some Electron-optical-tra~:acteristies of Single/-Filter-
lenses
PERIODICAL: Radioteldmika i elektronika, 1959, Vol 4, Nr 7,
PP 1145 - 1152 + 2 plates (ITSSR)
ABSTRACT: The picture in an electron EdL.~~roscope is produced by the
electrons which are elastIcally se,attered in an object;
the inelastically scattered electrons which lose a fraction
of their velocity during the i-nteraction with the object
form a background which reduces the contrast of the
picture and the resolution of the system. It is therefore
to be expected that the elimination of the inelastically
scattered electrons from the electron group which forms
the picture will lead to an iuiprovement in the resolution
and an increase in ttie contrast (11. B8rsch - Ref 2 and
0. Rang - Ref 3). This can be done by using special
electrostatic filter-.lenses. The work described aimed
at the investigation of such Simple filter-lenses. In
particular, the characteristics of the filterswere
Cardl/5 studied as a function of their geometrical dimensions.

Boni.e Electron-opti,cal Characteristics of SOV/101-4-7-8/25
Single Filter-lenses
The investigated lenses were used as the projectors in a
magnetic-type microscope. The experiments were carried
out on a special simple lens whose electrodes were axially
displaced (Figure 1). The lens consisted of three
electrodes. The upper electrode had a demountable
diaphragm, having a diameter of the aperture of 0.2 to
0.1 mm &ad could be displaced during the operation.
The supply system of the microscope was cis shown in FigiLre
2. The potential differenco between the cathode of
the microscope and the middle electrode of the filter-lens
was obtained from a dry battery by means of a potentio-
meter; the voltage at this electrode was about 55 to
50 kV. The experimental results are shown in Figures 3
and 4. The dependence of the transmission coefficient
and the magnification of the filter-lens on the ratio
k = d/b is given in Figure 3. The lens had the following
parameters; m = 1 mm; n 4 mm; h =.31 inm and the
potential of the cattiode U = 50 kV (Figure 1). The
Card2/5 dependence of the pramoters of the filter on the spacing a

JOK/102-4p7j~/25
Some Electron-optical Characteristics o Ing e i. er lenses
between -the upper and the middle electrodes is illustrated
in Figure 4; the lens had d = 2.5 mm and b = I mm .
The effect of the filter-lens on the pictures obtained
with a microscope is illustrated in the photographs of
Figures .5-8. The problem of determining the resolution
of filter-lenses can be studied theoretically. For this
purpose, the lens can be represented by the) model shown
in Figure 9. It is 2101T necessary to so'lire the Laplace
equation (Eq 1). The solution of this is sought under
the folloieing assumptions.,
7.) the potential in the space between the electrodes
deereapikk '.lineikrjy,' -and
2) the a~,6rturwih the outer electrodes are infinitely
long.
The solutions of Eq (1) 1' r the three regions shown in
Figure 9 can be written as 'Eqs (2), (3) and (11) , where
9Cn are the roots of J 0 (N:) = 0, J nW is the Besse'l.
Card 3/5

SOV/~01-4-7-8/25
Some Electron-optical Characteristics of Siz~gle I ter-lenses
function of the first kind of the order n . The
electron trajectories can be determined from-Eq (5),
where *11 is the acc eleraticu potential and I - is the
potential of the lens. The effect of the extra-axial
aberrations can be determined by integrating the equation
system given by Eqs (7) (G.V. Der-Shvarts - Ref 13). On
the basis of the experiments and the theory (which is
sometimes at variance with the experiments) it was found
that the absolute value of the iransmission of the lens
for h = const and k :.- d/b = variable has a minimum.
It was found that the aperture of the upper electrode
(Figure 1) limits the field of vision of the lens. In
fact, the field is compwatively small and makes It
difficult to employ the filter-lenses in practice. It
is possible to produce a filter-lens having a transmission
value of 20 V at a Dotentlal of U KO = 50 IrY which permits
obtaining a resolution of about 70 A when the object6r
magnification is 150. The c aleulat ions show that the
Card4/5 filters produce large chromatic aberrations and can lead

SOV/109-4-7-8/25
Some Electron-optical Characteristic-s of Single Filter-lenses
to a decrease in the re-e-olut-Lon of the microscope if the
magnification of the first opt--cal stage is small. The
chromatic aberrations increase consj~derably when the
optical systein is misaligned. Tbe authoras express their
gratitude to Yu.M. Ku-3hnir for his interest in this work.
There are 9 f�guves and 1-3 rterer-ences, of which 2 are
English, 8 German and 3 SovIet.
SUBMITTED: March 17, 1958
Card 5/5

er-Shirarts. G. V., Netrebanko, X. SOV/!18-23-4-1 6/21
Oomputing Apparatus for the Calculation of Fields of
,~J-'ctri~n Optical Syst('?ms (Vychisiitollnaya ust;movka 61:,a
retsche~-a poley olektronnoopticheskikh sistem)
1'.-..aI0DTCAL: Izvestilya Akademii nauk SSSR. Seriya fizichoq1-uiya, 1959,
Vol 23, 'Nr ',I I pp 5c)6'-,51o (USSR)
;41~STRACT: Cno of the basio- problemo in the oonstruction of electronic
C;Ysteras is the calculation of electric and magnetic fioldz;.
,.Pntion is made of a -oreparatory work (Ref 1) carried out
by both the authorsp in.which they showed that these
calcii1ations m~.y be carried out by mpans of -omputlers. The
iiroble.m is essentially that of fInding solutions of the
Lr;nlace and Poisson equations. The authors, partly assistc3
b,- 0. B. Belonozhko and V. N. Vzorov, have ee.,--.igned and
bvilt, a computer, which is specially suitable for the
solution of such probleirtia(axially symmetTical field problezins).
The block diagram of the computer is then d:Lscu.,,s(--6. It
consists of an integrating net;-~~rk, an nuto:untic
potentiometer, an arithmeticil block, a block with ma,-.11etic
'.al-d 1/2 taDe for the recording of cozitinuois solutioni; and the

A Computing Apparatus f or.the Xalculation of
Fields of Electron Optical Systems
printing-block with automatic recorder which records tho
discrete results4 Next, the integrator is more closely dealt
withi-It oonBists of 2500 current branchings whit-h are
arranged'in a large -rectahglb in the scheme..The number of
resistances is mentioned as being -5000. The CIOCUdic volta-&-
divider is then discussed. The whole apparatus is fed by a
storage battery of 30 v. The computer consisting of a total.
of 40 units is shown in figures 4 and 5. The measurement anrI
recording of the data obtained is fully automatic, as the
automatic potentiometer governs both the automatic recorder
and tape. A Russian accounting machine of the type SDU wa3
originally used as an automatic recorder, and later on a
GermaneRheinmetall'(GsE).In conclusion, the authors consider
the possibility of improving the automatic potentiometer in
order to use the computer also for the solution of other
problems pertaining to mathematical physics, c!)pecially for
the solution of Laplace and PoIsnon equations. ivhere are
5 figures and 6 references, A
of which are Soviet.
Card 2/2

AUTHORS: Der-Shvarts, G. V., Belen1kiyj S. A. SOV148-23-6-11128
TITLE: It obl em of' the Influence of a Chromatic Aborrationrof
the Dis-adjustment Upon tho Resolution of a Reflection-electron
Microscope (K voproau o vliyanii odnoy khromaticheskoy
abeTratEiii deyustirovki na raz-resheniyo otrazhatellnogo
elektroimogo mikroskopa)
PERIODICAL: Izvesti3ra Akademii nauk SSSR. Seriya fizicheskayal 1959s
Vol 2% Hr 61 PP 716-716 (USSR)
ABSTRACT- In the J~ntroduation, the reduction of chromatic aberration by
diaphraips in the objective of electron microscopes is
mentioned and the interest in the influence exercised by the
geometrJ:c dimensions of the pole shoes of the objective upon
the die-adjusting-abeTration is shown. When oaloulating the
aberrati: 'one of the trajeotories, four equations are given,
which had been introduced in an earlier paper by Der-Shvarts
(Ref 'I),, The magnetic potential between the pole shoes is then
investiiMted and the formulas (6) and (7) are deduced. By
differentiation of this equation the axial distribution of
induction components is obtained. For different values of
Card 1/2 nonmagnetic clearance and of the left-hand channel, values of

On the Problem of the Influence of a Chromatic Aberration $Dlr/48-23-6-11/28
the Die-adjuotment Uport the Resolution of a Reflection-electron Uicroscope
the axial distribution of induction are then calculated.
Calculation of the figures of aberration is dealt withaccording
to Gauss, and the resulto obtained are given by a table. For
the purpose of calaulating the dispersion from the data given
by the table as well as of the quantity charaeterizing the dis-
adjustment of the diaphragm two formulas (12) and (13) are
given. The influence exeroined by the confitructional parameters
of the pole shoos upon the onlargemont is distinctly shown by
the data given by the table. There are 2 figu:,-eB, I table, and
3 Soviet references.
Card 2/2

DER-SEVARTS, G.V.; RACHKOV, V.P.
Design of magnets for the excitation of lenses of magnetogitatic
electron mdaroscopea. Izv.AN SSSR.Ser.fiz. 25 no.6:676-,679 je
161. (mm 14:6)
(Electron microscopi)

24890
S/109/61/006/008/010/018
D207/D304
AUTHORS: Der--Shvarts~ G.V.# Kushnirf Yu.M. Rozenfelld, L.B.p
'&~ft 'ed 1 e nk i n , S - V. T r u t n e v a
Belenkly, S.A., Titov, L.A.
TITLE; Certain problems of reflex electron microscopy
PERIODICALt Radiotekhnika i elektronika, v. 6, no. 8, 1.961t
1358 - 1364
TEXT: This paper was presented at the 3rd All-Union Conference
on electron microscopy, Leningrad, Octo'ber 1960. The present arti-
cle describes an elect:-~on reflex microscope based on the design by
nh- PArt, W. Mprtv. R. Sqnorte (Ref. 1: C. r. Acad. Sci. 1955, 240,
20, 1975) who have shoim that by tilting the illumination system
by 15 - 200 in a reflex microscope, a good image may be obtained
with small deformation of thescale and a large useful imalge area,
The main deficiency of such a system in an electron microscope is
the chromatic aberration; the aberration can be reduced, *'Dy reduc-
Card 1/5

24890
S1109V61/006100810101018
Certain problems of' reflex D207/D304
ing the diaphragm aperture of the objective which in turn reduces
considerably the picture illuminations In the described microscope
the increased illumination was obtained by designing a more effeo-
tive electron gun and by utilizing a light intensifier. 10ince the
definition of a reflex microscope is determined by the diaphragm
of the objective, which means that in an electron microscope the
efficiency of the electron gun, is determined not by electron bright-
ness but by the current density of the sample, several types of gun
were Investigated; It was fouxid that triple electrode guns of spe-
cial construction produce a much greater current density than the
standard guns normally used in electron microsccpes, The special
feature of such a gun is the conical Eihape of the focussing elec-
trode. The dependence of current density j at the cross-over point
of the anode current was determined for electrode angles a of 600p
900 and 1200 with depth of penetration h of the tip of theoathode
filament (filament dia., 0.12 mm) with respect t) the cone a:pexj as
a parameter for maximum current density at U = 60 kV. The 'tempera-
ture of the-cathode was 28000K. The optimum results obtained are
Card 2/5

24890
S,/109/61/'006/008/DlID/018
Certain problems of reflex D207/D304
shown. For an electrode with angle a = 1200 9 h = 0.5 mm; fo:7 a
900 and 600, h = .1.5 min. For comparison. j = f(Ia) is also dravm
for the normal electrop gun YBM-100 (Ur-11-100), in which the tip of
the filament. is 0.,75 mm avove the foctissing electrode. It, may be
seen that for a = 1.200 the current, density is increased by approxi-
mately 4.6 times with a curreni: of 250 IiA and 7 times with a cur-
-rent of 500 pA. The electron giin is mounted in the illumination ,
system of -the microscopo. The gun is introduced through a jacketed
port and can be mechanically rotated through any angle from 00 to
220 measured on a vernier scale-. The electron op-~ical magnifica-
tion of the microscope is x2500, resolution about 500 L The, au-
thors also undertook theoretical.analysis of the influence on the
finition of imperfect assembly and shape of magnet cores~ Since
the picture is formed by electrons undergoing considerable decele-,
rations, the axial deformation of the magnet slots and errors in
't?heir axial positioning produce a constant magnetic field near the
axis and perpendicular to it, :Such a field has analyzing properties
and may introduCe chromatic aberration. The evaluation of such ab-
errations requires the determination of the corresponding pertur-
Card 3/5

24890
S/1 0 9/6 1/00 6/008/010/018
Certain problems of reflex D2()7/D304
bation potentialsp normally evaluated by Bertein's method,, It may
be shown, however, that -this inothod does not determine the exact
boundary conditions necessary fcr solving -vhe problem of zvhe Lapla-
ce equation for perturbation -otentialso This problem may be solved
P
exactly only when it is assumed -'%-.ha.t the ptrturbation is very
small. The modified Mathieu func~'Vions may be then reduced -to the
sums of Bessel functions, whose terms are multiplied by the para-
meter of the Mathieu equations In their analysis the authors con-
cluded that there is no general method for evaluating the pertur-
bation potentials and used the integral of an ordinary 18YET to de-
termine them in the near axial regions The details of the analysis
are not givens The poles used had the geometrical form with s/d
ratio of 1.5 [Abstractor's note: Symbols d and s not defined]. The
authors also investigated the filter lenses in an attempt to in-
crease the resolution of t:ae reflex microscope. In their analysis
[Abstractor's note: Details not given] they used the mathematical
model of single electrostatic lezises of 17. Glaser and P. Schiske
(Ref. 13: Optik, 1954, 11, 9# 42.2; 1954t1l, 10, 455; 1955, 12, 5t
233) and of R. Rfldenberg (Ref. 14: J. PrEmklin Inst. 1948, 246t 4,
Card 4/5

109/6-1/006/008/ n0/018
Certain problems of' ref2ex D207/D3,)4
311, 246p 5t 37*j). The analyais sho,;ied [Abstractor's not-e.- De--
tails not given th.at the re-Solution of the lens is basically di-
mited by the fact -tbat rion-axial achroma,:io are being
foe.ussed in. d-M~rent
pl,--Anes, Vii "11 an -e-nerg,., of eI--I~-,'r(,,r1.-,-
of the order of 9-6 OV & backgrolind is, vlhl,,~Ih
the picture disappears. There ar,~ 10 figures and
non-Soviet-b"'Loo references, The referenoes tu th~~ 4 illos-r. recent
Engliah-language publ 'Jcatlons re;3-i i')s fol'ovist. !,',E. Hailn'e, P.~.
Einsl.ein, Brit. J. Appl, Phy~~ 2, 1.0, P.A. Sturrf)---Ik. Phi-
los. Trans. Roy Soc. London, A~ 24,i, 368, 387; G.D. -,Iirc~~Lard-
JQ Scient. Irislu-rLIM. 1~153, -30, LO, 35.3; R~ Ruaenber.-~, J. F-ark~-'
inSt*., 1948.. 246, 311; 246, 5, 377;
SUBI-AITTBD: February 7j.196:I
Card 5/5

DE&--SMEARTSL,-f"V-4 KUSHNIR, Yu.M,.; ROUNFELID, L.B.; ZAYTSEV, P.V.;
BEZLDIIIKINP S.V4
libdernizing the UB14-100 microseopeo IzvoAN SSSR.Ser.fiz. 25
no.62721-724 Je ;61. (MIRA, Il+-.6)
(Eleatron microscope)

S11 09/62/007/001 /015/027
D246/D301
AUTHORS: Der.-Shvartsp_ _.G..,.V. 9 ard Belen'kiyy S, A.
TITLE-. Investigating the aberration of electronic lens
filters
PERIODICAL: Radiotekhnika i elektronikag vo 79 no. 19 1962p
126 - 132
TEXT: The aberrations of the so-called electrostatic lens-filter
proposed by Mrsch have been investigated so far by using inadequa-
te methods. The authors use solutions of the equations of traject,
ry in two well established mathematical models for this purposeg as-
suming that the lens is used as a projecting lens of electron micro-
scopes. Making assumptions about the expected working conditions of
such a lensp they derive characteristic data concerning the aberra-
tions ofthe lens, which are summarized in Table 1, where d - half-
width Of the axial potential distribution, r = 0 for the axi.s. Cal-
culating the aberration for a point on the axis, the authors a.ssu-
med TTV = 35 kV electron velocity and two different sets of condi-
Card

S/109/62/007/`001/015/027
Investigating the aberration of D246/D301
tionss losses through the object, (A U V)max = 4.3 V and (A Udmax
= 10 V and magnification M = 97.5 X and M = 104 X respectively. Th
results are tabulated. The approx-.-mate radius of chromatic aberra-
tion of position for the cases aro (Scap)max, /M --~j6900 and 289000 A
respectivelyo For the second set of conditions the aberrations for
off-axis points were also calculated along 2 trajectories. Results
for geometrical and chromatic aberration are given in tables. The
authors' conclusion is that chromatic aberrations of' lens filters
are quite large. The geometric aberrations for off-axis points are
also too large. Hence,,the use of lens filters in reflection micro.-
scopy lacks perspectives. They may be used in illumination micros-
copy as intermediate lensest if losses in the object are smalls
There are 3 figures, 5 tables and 10 referenoes~- 5 Soviet-bloc and
5 non.-Soviet-bloc. The reference -,o the English-language publica-
tion reads as follows: R. RtIdenberg, I. Franklin, Inst.9 1948, 246,
3229 377.
SUBMITTED: Jime 19, 1961
Card 2P_,"
'Q

s/io5/62/000/012/001/003
E140/E435
AUTHORS: Der-Shvarts, G.Vo, Trutneva, I.S. (Moscow)
TITLE',: The design of electron--optical elements for electron-
beam machining installations
PERIODICAL: Elektrichestvo, no.12, 1962, 34-38
TEXT: The authors refer to two publications by E.B.Bas 10ptik,v-12,
1955, 71 Vacuum Sclence and Technology, Pergamon Press, v.2, 1950)
concerning electron-beam welding. It is not the purpose of the
..present article to discuss I-the use of electron beams for
dimensional machining or the'detalled design of the electron-
optical elements for forihing the-beams but rather to enable a
rapid check of the suitability of a given,system for the purpose.
Estimates ~re given of the e~fectu of 'chromatic aberration and
third.-order spherical aberration on the position and preeldian of
the beam. Two numerical examplei% are worked to show how the
required power supply stability can loke determined and how different
lens-configurations may be comparod.3' There are 3 figures and
2 tables.
SUBMITTED: February 17, 1,962
iCard 36 /1

DEP~SHVARTS, G.V.; TRUTNEVA, I.S.
Potential of an i , rsion lonse with elliptical electrodes.
Radiotekh. i elektrom. 7 iio.8-.1462-1464 Ag 162. (MIRA 15:8)
(Electron optics)

JER-SHVARTS, G.V.; KULIKOV, Yu.V.
Contribution to the theory of toler"Lne-33 in electron-optical
devices. Radiotekh. i eleltron. 7 no.12:2067-2071 D 162.
(MIRA 15:11)
(Electron optics-Equipment and supplies)

KUSFINIR, Yk~.M.; FETISOV, D.V.; PER~SHVARTS,-G.V.,; POCHTAREV, B.I.; MKMV, P.D.3
RASPLETIN, K.K.; SPEKTORP F.U.; GUROVA, R.P.; POSTNIKOV, Ye.B.;
OSIPOV, V.A.; PAVLOV, V.A.; POGUDINA, M.7.
Combined scanning elec *tron microscope and X-ray microanalyzer with
magnetic electron optics. Izv. AN SSSR. Ser. fiz. 27 no.9-. .
1166-1172 S 163. (MIRA :16:9)
(Electron microscope) (X-ray spectroscopy)

~ )_ .; WHKOV, V.P.
DER-SHYART
Study of the distortion of the formll oT electronograms origJnatIng
in microdiff'raction. Radiotakh. i elektron. 9 no.8sl476-1481 Ag 164.
(MIILA 17tlO)

KUSHNIR, Yu.M.; FETISOV,, D.V.; DW
IWAN, G V - POCHTAREV 13.1.1 TOKAREV, F.Dq
-=--Oi I
RASPLETIN, K.K.; GUROVA, R.P.1 POSTMKOV, Ye.B.
The REMP-1 scanning-ty
, pi electronic microprobe instrument. Zav.lab. 30
no,12*.1510-1512 164- (MIRA 18R1)

q_. NR*. ~:--Ap

Iqr,
.

DE2.-SIRTA-RIPS, G.V., RAGITK~'jv, V.P.
~'- c- clectron-optAcql features of tw,,,~-nlot lenses.
"rvT k !~!;di:itckh. i
elektron. 10 no.- 11 1
5,922-928 My 165. 'MiTIA 1&5)

L 08093--�l JI)
AP -G0UR--CE-C'WF1 .-L6/701-13/66/ooo/ol5/0063/0064
ACC NR1 6029900
INVENTOR: Kushnir, 1.,U*,r9t,'.R6zenfel'd, L. varts, V.;Kagan B.
OPG: none
TITLE: -MiLr2gR2pe t-~Te- Class 21, No. 18L,366
SOURCE: I zobret prom obraz tov zn, no. '.5, 1966, 63-614
TDPIC TAGS! microscDp6.,C'fi'?ld emission microscope
ABSTRACT: The'propohed microscope of the ion emission ty2e contains an axisyTmetric
electrostatic optical.systeii, a diaphragn, a device for separating ions of Specific
mass from the ion beaih, an ion collector, such as the first dynode of a secondary
electron multiplier, an amplifier, and a recording unit (see Fig. 1). To increase
microscoDe resoluticn wid to mak-e possible the Cceervation of the! distribution of
Yarious chemical elements.cn the surface of the ciample, a scanning aysterr.,, synchronizej
Nrith the control unit- andli3.dmiltting through the (-11aphragm rm CD:Larged icin image for
every element, is us'ed%'ih. ihe- microscope. For the same purpose, -the device Vh1ch
Card Mr! 6pi.

-77
.U U -s-67
L 0809-
NR% AP6021.~90D
Fig. I. Ion emigsion microscope
1 Diay~hragin; 2 - oysUem for separating
ions ~~P specific cross from the ion bewn;
3 ion collector; 11 aalplifier;
rcco..,.-Ung unit; 6ncorining, nyatem,
5
1
separates the ions oP spec~'flc mass from the ion beam Is placed between ithe aial-.1irilgm
and the ion collector. Or-I iirt. has: 1. figure,
SUB CODE; 20/
Card 212

DER-SIRTARTS., G.V.; HIKAROVA, I.S.
Calculation of spherical. and axisymmOxical abberation of
magnetic lenses. Radiotz-Idi. i elektron. 11 no-1:89-93
ja 166. (MIM 19: 1 )
1. Submitted SeptemIlDer 25, 1964.

GOL~ I., prof.r FLORESCU, I., dr.; DER)MA, Zo, dr.; PODUT, A*p dr#
Consideraticma on the visceral findings and otiopathoge-nosis of
Schoenlein-Elemoch's 'divenoo. Had. intern.., Bucur 13 no.1:25-32
-Ta 161.
1. Incrare efectuata in Clinica a XI-a medicala, Cluj.

DERSI
I
Some standpoints concerning labor safeguard. Muez elet 15 7
mr 6o. (EUI 937)
(Hungsary-Industrial safety)