SCIENTIFIC ABSTRACT MILOSLAVSKIY, V. K. - MILOV, A. I.

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CIA-RDP86-00513R001134320007-0
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December 31, 1967
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SCIENTIFIC ABSTRACT
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infrared ~'.bscrption by Thin Layers of Tin Dioxide 5011/51-7-2-16/34 above +1501 the resistance fall exponentially with increase of tecaperature. The observed behaviour may be explained by introduction of chlorine io.rs an impurities in the preparation stage. Such chlorine ions may replace oxygen ions,-producing donor levels which can spread out into an impurity band at chlorine-ion densities above 1019cm-1. The author found also thit the electrical conductivity of SnO2 layers may be increased considerably by introducing antLaony into the oxide lattice. This is done by adding a small amount of SbCl,3 to SnC14 in the preparation stage. In this way layers with a conductivity of 103-104ohm-lcm-1 could be, easily produced. The resistance of such layers rises with temperature as in uetals and they exhibit considerable absorption in the infrared region. AcicnowledUaents are iw-da to K.D. Sinellnikov for suggesting the subject, I.N. Shklyarevskiy and N.A. Vlasenko for their advice and D. Smelov for his help in experiments. There are 4 figures and 11 references, 7 of which are Soviet, 2 Ingl-Ash, 1 German and 1 translation from English into Russian. SUILUTTEDs November 11, 1958 Card 3/3 80558 1+3 3/0 51/60/008/06/019/02 4 14.74co 3201/1691 AUTBMS i Miloslavakly. VA. and Lyashonko, S.P. 1~ 1-7 TITIA s optical and Ilectrical Proportion of Thin IAY*rs of Tin Dioxide FMODICALs Optiks i spoictrookopiya, 1900, Vol 8, Nr 6, pp 668-674 (USSR) ABSTUCTs The paper reports an investigation of the temperature dependences of the Hall constant (Fig 1) and the electrical conductivity (Fig 2) of thin tb-doped 1;Lyere Of 8002 in a wide range of tomperatures, (200-30000). of the wavelength dependence of the transmission coefficient between 0.35 and 2.5 p (Fig 3)and of the optical roflectivity between 1.5 and 6 p (Fig 4). The samples were prepared by deposition of 3zGlj with a small amount of SbCl3 an glass plates ihich were thon heated. Introduction of antimony vas fourA to increase the electrical conductivity and the carrier density (up to 1021 cm-3) or anoz layers. The samples used had carrier densities N - 2 x 1019 - 1021 40-3 (cf. the table on p 870). The optical density per unit thicimeas of the ample (at A - 2.5 )L) me found to be directly proportional to the electron density N deduced from the Hall *.m.f. (Fig 5). This indicates that absorption in the near infrared region Card 1/2 is due to conduction electrons. The authors calculated also th6 80558 S/0 51/60/008/06/019/02 4 2201/3691 Optical and Electrical properties of Thin Layers of Tin DIwddo optical coastants n and k in the absorption-edge region (1.7-2.5 11) from the experimental values of the reflectivity &W tho.tranmission ed4ifficient, and imam thicknesses of the somples. A simple relationship betwom the real part of complex permittivity, C, and the optical constants given by E= A2-k2. 4ON02 (3) 0 MsE402 (where a is the electron charge and e is the effective carrier same) use used by the authors to find C. The linear decrease of F- with tbe squaro of wavelength is ohamon in Fig T. Acknowledgments are made to I.N. Shklyarovoidy " N.A. Vlassako for their advice. There are 7 figures, 1 table and 10 references, of which 5 are Soviet, 1 English, 2 Geman, 1 Japanese and I translation from English Into Russian. SUMITTED: Noimber 9, 1959 2/2 SHUTARVSKIY, I.N.; VIASIM, N.A.; MIWSLAVSKIT, V.I.; NOSUIJM, N.A. I Value and sign of the phase difference A,-Sj-ES. Opt. i spektr. 9 no.5:64o-643 ii 16o. (KW 13:11) (Reflection (Optics)) (Metals-Optical properties) ,,- VLASEITKO, N.A.; MIWSIAVSKI ~-~ 0- SHKLYAPZVSKIY, I.N. Interference of luminescent radiation from. sublimate phosphors. Opt. i apektr. 11 no.3:403-409 S 161. (MIRA 14:9) (Phosphors) (Liminescence) MILOSLAVSKIY, V~K.; RANYUK, A.I. .11 . .... -- Optical constants of cadmiwa oxide in the infrared apectra region. OptA spektr. n n0-4.'53&-541 0 161. (IMA 11,. 10) (Cadm-ium oxide-Optical properties) S/051/62/012/oo6/oi8/020 E032/E4i4 Au'rHORS: Shklyarevskiy, I.N., Nitiloslavakiy V.K. TITLE: On the magnitude and sign of the phase difference Z~ = 6 p - 6s PERIODICAL: Optika i spektrookopiya, v.12, no.6, 1962, 793-795 TEXT: In a previous paper (Opt. i spektr., v.9, 1960, 64o) the authors discussed the phase difference L^S = 6p - bs where SP and 6. are the phase shifts of the p a rid s components of the electric vector at a given angle of incidence of light on the surface of a metal. It was shown that the magnitude and sign of this difference can be unambiguously determined by direct measurements and such measurements have in fact-now been carried out. However, N.Ya.Gorban' and I.A.Shaykevich (Opt. i spektr., v.ii, 1961, 750) have obtained results which do agree with these conclusions. A further analysis of the Fresnel reflection coefficients is now used to show that the present authors' conclusions reported in the previous paper still hold and that Gorban' and Shaykevich have used an incorrect interpretatioi-,. There are 2 figures. SURMWTED: January 12, 1962 Card 1/1 39869 S/C5l/62/Gl3/0C2/'GG3/Gl4 E032/E514 ~, AUTHORS: Vlasenko, N.A.,,Miloslavskiy,V.K.-and Shklyarevskiy,I.N. TITLE: On the origin of Brewster and super-position fringes PERIODICAL: Optika i spektroskopiya, v-13, no.2, 1962, 250-255 TEXT: The conditions necessary for the appearance of Brewster frin6es in white light and super-position fringes in monochromatic- light are discussed in the general case with allowance for multiple reflections within each plate. The two types of fringes are carofully defined and the differences between them are brought outs In each case an explicit relation is'given for the intensity distribution. In the case of Brewster fringes, the corresponding intensity-distribution formula is used to establish a condition for the continuity of the achromatic fringe. In fact the achromatic fringe is continuous (visual observation) provided t &-,) > 2.5, where t is the plate thickness hnd A-,) is the wave number difference corresponding to the spectral range employed. The final section is concerned with the analysis of Brewster fringes which are produced when a two-beam interferometer, e.g. the Jamin interferometer, is crossed with a silvered plane- Card 1/2 On the origin of Brewster and ... S/051/62/013/002/008/014 E032/E514 parallel plate. Analysis of the corresponding intensity distribution shows the presence of several achromatic fringes and it is suggested that these fringes may be useful in speeding up the adjustment of two-beam interferometers. They may also be the measurement of the thicil useful in rapid-order counting and Cness of plane-parallel layers. There are 5 figures. SUBMITTED: July 17, 1%61 I.Card 2/2 /014/00it/013/026 s/o5i/63 Eo3g/F.420 AUTFJOn: mooslavskiy. V.9. The optical properties of thin US layers in the I region 0.4 to-18 IL spectra PERIODICAL: Optil-a i spolctroskopiyA, v.11j, no.11,_ 1963, 527-531 TEXT- Layers. of,CdS are prepared -by-vacuum evaporation from blo'' and Ta ova'poratord. Partial dissociation of CdS occurs when heated near to r its'.sublimation tomperatu o in Vacuo. Tito US layers therefore contain a surplus of Cd metal which alters their conductivity. : This surplus of Cd can be determined T' investigations in the infrared-region of tile cheittical ly Or spectrunt layer -built up.on thin slices a of CdS$:2 to 3~ thi k,wore qr r6ck..;a1t.' The'. transmissioa. of these layers was measured in tile WaveLength range 0. 4 to 18 ~,i - by ~ means or a: MKC -2 (IKS-2) spectrophotometer. Typical results show good transmission in the -:.-range 2 to- 5 tA while' a noticeable absorption occurs at-longer Wavelengths.: This absorption increases with increasing X and he' ' mple In order to "also w i h incroasing,conductivity 'o-r:t sa 1. o "Ah6 dependence o elucidate the-naturelof these -observat nis C rd 1/2 ArD 11 June AMPI.~JFJCATION OF MACNETOOPTICAL EFFECTS (USSR) Milosh!I~~V. K.'_ Optika- i spektroskoplya, v. 14, no. 4, AprI953, 532-536. S/051/631014/004/014/026 The principle of multiple-beam interference is considered. as a rneansof ampli fylrjg -the magnetooptical Far-aday and Kerr effects. ~ Because of excessive absorption in the visible portion of the spectrum, semiconductors are regarded as inferior to dielec- trics.used ir. ., -.'iunction with highly reflective coatincts. . Interference p"D10filters filled with a dielectric coated with partially transparent metal were used in an ex- perimental study of the Faraday effect. Filters with a 0.95 reflectivity coefficient can increase the rotation of polarization plane 20 times, permitting. the use of much thinner dielectric films to observe the F araday elf-fect. When Polarization ellipticity is ac.dounted I"or in the Kerr-eflfv~ct rotation an-le, its Ifunction. of phase difference show4 an asymmetry which has been cyperinientally observed in such specimens as permRIloy- oxide, stleel-oxide, and steel- quartz -silver. [JA Card 1/1 LY-(, :311'-- ~-H, , ~S. 1'. ; i"I'l II Y, V - K. Detemining the effective mass in tin dicxide from 0-.,Lical constants in the infrared region. Fiz. tver. tGla 6 no.8.:2560- 2562 Ag 164. (Ilip," 1,7: 11) 1. laarlkovskiy gosudarstvenriyy universitet imeni Grr I knjo. ACCrSSION XR: AP4011498 S/0052/64/016/001/0151/0153 AUT11OR: Lyashenko,,S.P.; Miloslavskiy, V.K. TXTIX: A ~implc method for determining the thickness and optical constants of seid- conductor and dielectric layers SOURCE: Optika i spektroskopiya, v.16, no.1, 1964, 151-153 TOPIC TAGS: optical constant, index of refraction, absorption coefficient, trans- mittance, layer thickness, dielectric layer, dielectric coating, semiconductor layer, semiconductor coating : A13STIZACT: A method is proposed for determining the thickness and the optical con- stants (the index of refraction n and the absorption coefficient k) of semiconduc- tor and dielectric layers. Whereas conventional procedures are based on either si- multaneous measurement of the reflection coefficient R at normal incidence. the transmiUance T and independent measurement of the thickness or on comparison of the transmittance (or reflection) for two different thicknesses, the present method is based on measurement of the transmittance T in a wide spectral range. The method can be used in pll cases hen thefe Is an extensive region wherein n Is such great- er than k. Formulas are al:ucod f6r evaluating n, k and thii thickness from the suc- Card 2/2 ACC.*R-. AP4011498 cessive maximum and =in" Valuds of T. BY Way Ofoillustration the optical con- staq,ts are computed for #a SnO2 layer on the basisrof an experlmental T versus X cury'e. It is n9ted that althoughfithe accuracy of the proposed methaid for determin- ing the thickness and o*ical constants is not an high. as that of the conventional interferometrlip method At"-Is adequate inquany casemi. Or1C.art.has: 9 formulas, 2 figures and I table. ASSOCIATION: n9ne SUBMITTED: 249ar63 DATE ACQ: l4Feb64 ENCL: 00 SUB CODE: PH NR UP SOV- 003 0MR.. 001 it 2/2 Cold r ,14k~O-SLAVSKIY, V.K.; SHRYOUSKIY, I.N. Further on the appearance of Brewster bands and superposition bands. Opt. i spektr. 16 no.3:528-529 Mr 164. (14IRA 17:4) MILOSLAVSKIY, V.K. % .............. w---- -, , Characteristics of the Faraday effect in thin absorbing filzo, Opt. i opektr. 17 no.3:413-417 S 164. (MIRA 17:10) L 34545-65- W7(1,)/=- (WEEC(b)-2 Pi-.4 WP(b) ACCESSION NR.i AP4048751 s/oo5lA4/017/005/0765/0770 AUTHORS: Shklyarevskiy, 1. N.; K Goloyadova, V. 1. L~si kt k L De ros OF~~&~_ TOPIC TAGSi'.'~ -1 1: ieffit'Ambakference, uminescence, coherent optical propagati,on: ABSTRAM. A quantitative study was made of interference of lumines- cence light with an angle (p = 1800 between the interfering beams. Such measurements have become feasible only recently by the avail- ability of modern equipment with which to measure weak radiation. A thin luminescent layer (solution of pyrazoline and polystyrene in an organic solvent) was deposited on a thin mica plate (5--10 ~L). After evaporation of the solvent the layer had approximately the same re- fractive index as the mica. The second side of the mica was covered L 34545-65 ACCESSION kR":' 464~.8751, "tr-a~nspa-reht-._~ _f silver (refledtIoncoefficient on with a* -semi I er-o the micasldia,about~..85% for X =.550.nm. The sample was placed in front of the spectroscope slit and illuminated, as shown in Fig. 1 of the Enclosure by:ultraviolet light (X = 365 nm). The lumines- cence propagating -along the normal from the sample surface was passed through_ a.monochromator and recorded with a photoelectric set- up using an~ FEU.-,2.~~k--.-ljho.to,multiplier. A system of interference lin.es of 6onstantwavielengthwas produced by the plane-parallel gap ,mica an comprising-t-he the luminescent layer. The visibility of the interference lines' was recorded and compared with calculations based on the plane-wave approximation. The experimental visibility was lower than calculated, owing to non-uniformity of the thickness of the luminescent layer, light scattering by various defects, and other unaccounted for factors. Orig. art. hast 5 figures. ASSOMATION: None -7 IA. riq, 1. Schemtic arranaemmt of illumination syjter~ L F PW-2 .cart( bo L -ACCESSION NR: AP5012574 UiR/0181/65/007/005/15 W AUTHOR: 14loslavsklyj V. K. Lyashenkop S. P. n TITM: Concentration shift or the edge or the intrinsic absorption band 11 0 dioxide SOURCE: "Lika, tverdogo tela, V. 7., no- 5.- 1965.- 1550-1552 TOPIC TAGS: tin compoundp absorption edgej, refractive index, light transmission ABSTRACT: The authors observed and investigated the shift of the intrinsic tion edge,of SnO21 the red boundar7 of which is located at 4 eV. The measurements were made on polycrystalline layers deposited on a quartz substrate. The electron density was varied by introducing antimoqr atoms. The refractive index (n - 1.93) was determined from interferometric transmission curves in the visible region. The width of the forbidden band was 3.9T eV,,* in fair agreement with data on temperature', t measurements of the conductivity. The experimental points fit well the theoreticaL formula for the,connection between the shift and the electron density. The value of the reduced effective mass, (0.48 � 0.02)m, necessary to reconcile these data WithLthe theoryy is close to the value of p obtained from the spectral varia- tion of the absorption of the eample.with the lowest electron density. On the other handp the value of obtained in the present work differs noticeably from Card t 00679-66 ACCESSION NR i AP5012574 ~_,Ithe ohmic reffective mass obtained from the spectritl variation of the real part of the dielectric constant in an earlier investigation by the authors (nT v. 6, 256o, 19&). The difference Is attributed to anisotropy of the dispersion in the con- iduction band* Or1g. art. has,. 2 figures and 2 formulas. ASSOCIATION: Kharlkovskiy gosudaretvennyy universitet (Khar1kov State University) SUBMITMM: 05Nov& ENCL: 00 OP MM CODE: GSP .,.NR REF SOV: 003 OTHER: 004 C Jjp(c) JDIGG EWT(1)/EV1TW/EPF(C)/EWP( VT/EWP(t)1Et4P%1'~V' L 4448-66 ~ACCESSION NR: AP5017899 UR/0051/65/019/001/0108/0114 - 535-32 + 535-341 AU" 111ORS: Ejashenko, S. 1-; Miloslavokly, V. K.- TY'5_5 5 Study of the optical properties of tin dioxide thin films in the visible and ultraviolet regions "I- 12~7 TV-7.7; 1"6 SOURCE: OPt1ka i spektrookopiya, v. 19, no. 1, 1965, 108-114 TOPIC TAGS: tin compound, optic measurement, optic property, optic spectrum, UV spectrump absorption edge ABSTRA:6T*: in view oIf the appreciable divergence of the results ob- tained by different.authors, apparently owing to the,use of different ,criteria.for eatimating the edge of the.fundamental band, the authors 'investigated,tbe optical constants of thin SnO. films with different carrier densift Ies in the range from 1.1 to 0.23 p.-Phin layer of SnO was deposited on a quartz,plate heated to temperature > 500C by .2 A.method described by ~he authors earlier (Opt. i- -spektr, 8,,' 868,, 1 4448-66 ACCESSION NR: AP5017899 -1960)i The transmission and reflection of the samples was measured 'with a spectrophotome-ter (SF-4). The optical constants and the thick- ness of the layer were measured from the interference transmission , .curves, as described by the authors earlier (Opt. i spektr. v. 16, 80, a A special attachment for.the spectrophotometer was used to .measure the reflection coefficient at wavelengths shorter than 0.35 tL, '-V The results show that for energies greater than 4 eV the absorption Is due to the direct allowed interband transitions, and that for jower energies it depends on the lattice imperfections. The frequenc :dependence of the absorption of strongly doped samples was explained. The temperature de- on the basis of the theory of distorted bands. ,, pendence of the absorption edge was also investigated and it was -ifound that the absorption edge increases linearly with decreasing -;4 Umperature, at,an average rate of 6.5 x 10 ev/deg. The actual'- ivalue of the absorption.ed e depends on-the carrier density, ranging . perature. !The authors from approximately 3.'8 to Z4 ev..at room tem _ ,'f6r- , thank I. N. Shklyarevskiy anti R.A. 'iarov&_, valuable discussions.' , , , . r g ar has,.F~_rlgures and rormuias-, _ , '.6rd I 17878-66 W(l) ACC NRs AP5027673 SOURCE Colso UN(b051A5/019/005/0M/W" AUTHORt MaeUvoklys To 9q F^sanavt A. N. MGt none TITLE z MMjtIpjL*-jM" interference in a wedge soURcIt IOptika I spektrookoplyat T. 19# Do* 5P 1965P 7W-7" wave "chanlost TOPIG TAGM7 maculation light reflection coefficient, light interferencel light source ABSMCTs Multiplo-wave Interference Amn a point source situated near an air wedge was theoreticallr interpreted by plotting the sequence of Inaginary source formefi by multiple reflection from two surfaces of the wedge., The sequence of coherent sources was eltu&W In the main section of the wedge (in the plans perpendicular to the aide of the wedge) on.the circle passing through the real source and having a center In the side of the wedge* -The circle on which the locallsation'of Interference fringes was observed passed througft the Aft of the wedge and was tangent to the circle of asherent sources in the point of a true sources. It was shown that the conditions of a dIstIn4A visibility we qontro L UbCs $35o412 is the coefficient of reflection age e1tWilaceso The linear sixe of the (uhare I 1e the avarag angle of source can be evaluated MrQ*ZAUFds -qs!,Kcosj