SCIENTIFIC ABSTRACT MILOSLAVSKIY, V. K. - MILOV, A. I.
Document Type:
Collection:
Document Number (FOIA) /ESDN (CREST):
CIA-RDP86-00513R001134320007-0
Release Decision:
RIF
Original Classification:
S
Document Page Count:
100
Document Creation Date:
January 3, 2017
Document Release Date:
July 31, 2000
Sequence Number:
7
Case Number:
Publication Date:
December 31, 1967
Content Type:
SCIENTIFIC ABSTRACT
File:
Attachment | Size |
---|---|
CIA-RDP86-00513R001134320007-0.pdf | 2.31 MB |
Body:
infrared ~'.bscrption by Thin Layers of Tin Dioxide 5011/51-7-2-16/34
above +1501 the resistance fall exponentially with increase of tecaperature.
The observed behaviour may be explained by introduction of chlorine
io.rs an impurities in the preparation stage. Such chlorine ions may
replace oxygen ions,-producing donor levels which can spread out into an
impurity band at chlorine-ion densities above 1019cm-1. The author
found also thit the electrical conductivity of SnO2 layers may be increased
considerably by introducing antLaony into the oxide lattice. This is
done by adding a small amount of SbCl,3 to SnC14 in the preparation stage.
In this way layers with a conductivity of 103-104ohm-lcm-1 could be,
easily produced. The resistance of such layers rises with temperature
as in uetals and they exhibit considerable absorption in the infrared
region. AcicnowledUaents are iw-da to K.D. Sinellnikov for suggesting the
subject, I.N. Shklyarevskiy and N.A. Vlasenko for their advice and
D. Smelov for his help in experiments. There are 4 figures and 11
references, 7 of which are Soviet, 2 Ingl-Ash, 1 German and 1 translation
from English into Russian.
SUILUTTEDs November 11, 1958
Card 3/3
80558
1+3 3/0 51/60/008/06/019/02 4
14.74co 3201/1691
AUTBMS i Miloslavakly. VA. and Lyashonko, S.P.
1~ 1-7
TITIA s optical and Ilectrical Proportion of Thin IAY*rs of Tin Dioxide
FMODICALs Optiks i spoictrookopiya, 1900, Vol 8, Nr 6, pp 668-674 (USSR)
ABSTUCTs The paper reports an investigation of the temperature dependences
of the Hall constant (Fig 1) and the electrical conductivity (Fig 2)
of thin tb-doped 1;Lyere Of 8002 in a wide range of tomperatures,
(200-30000). of the wavelength dependence of the transmission
coefficient between 0.35 and 2.5 p (Fig 3)and of the optical
roflectivity between 1.5 and 6 p (Fig 4). The samples were prepared
by deposition of 3zGlj with a small amount of SbCl3 an glass plates
ihich were thon heated. Introduction of antimony vas fourA to
increase the electrical conductivity and the carrier density (up
to 1021 cm-3) or anoz layers. The samples used had carrier densities
N - 2 x 1019 - 1021 40-3 (cf. the table on p 870). The optical density
per unit thicimeas of the ample (at A - 2.5 )L) me found to be directly
proportional to the electron density N deduced from the Hall *.m.f.
(Fig 5). This indicates that absorption in the near infrared region
Card 1/2 is due to conduction electrons. The authors calculated also th6
80558
S/0 51/60/008/06/019/02 4
2201/3691
Optical and Electrical properties of Thin Layers of Tin DIwddo
optical coastants n and k in the absorption-edge region (1.7-2.5 11)
from the experimental values of the reflectivity &W tho.tranmission
ed4ifficient, and imam thicknesses of the somples. A simple
relationship betwom the real part of complex permittivity, C, and the
optical constants given by
E= A2-k2. 4ON02 (3)
0 MsE402
(where a is the electron charge and e is the effective carrier same)
use used by the authors to find C. The linear decrease of F- with tbe
squaro of wavelength is ohamon in Fig T. Acknowledgments are made to
I.N. Shklyarovoidy " N.A. Vlassako for their advice. There are
7 figures, 1 table and 10 references, of which 5 are Soviet, 1 English,
2 Geman, 1 Japanese and I translation from English Into Russian.
SUMITTED: Noimber 9, 1959
2/2
SHUTARVSKIY, I.N.; VIASIM, N.A.; MIWSLAVSKIT, V.I.; NOSUIJM, N.A.
I
Value and sign of the phase difference A,-Sj-ES. Opt. i spektr.
9 no.5:64o-643 ii 16o. (KW 13:11)
(Reflection (Optics)) (Metals-Optical properties)
,,- VLASEITKO, N.A.; MIWSIAVSKI ~-~ 0- SHKLYAPZVSKIY, I.N.
Interference of luminescent radiation from. sublimate
phosphors. Opt. i apektr. 11 no.3:403-409 S 161. (MIRA 14:9)
(Phosphors) (Liminescence)
MILOSLAVSKIY, V~K.; RANYUK, A.I.
.11 . .... --
Optical constants of cadmiwa oxide in the infrared apectra region.
OptA spektr. n n0-4.'53&-541 0 161. (IMA 11,. 10)
(Cadm-ium oxide-Optical properties)
S/051/62/012/oo6/oi8/020
E032/E4i4
Au'rHORS: Shklyarevskiy, I.N., Nitiloslavakiy V.K.
TITLE: On the magnitude and sign of the phase difference
Z~ = 6 p - 6s
PERIODICAL: Optika i spektrookopiya, v.12, no.6, 1962, 793-795
TEXT: In a previous paper (Opt. i spektr., v.9, 1960, 64o)
the authors discussed the phase difference L^S = 6p - bs where
SP and 6. are the phase shifts of the p a rid s components of
the electric vector at a given angle of incidence of light on the
surface of a metal. It was shown that the magnitude and sign of
this difference can be unambiguously determined by direct
measurements and such measurements have in fact-now been carried
out. However, N.Ya.Gorban' and I.A.Shaykevich (Opt. i spektr.,
v.ii, 1961, 750) have obtained results which do agree with these
conclusions. A further analysis of the Fresnel reflection
coefficients is now used to show that the present authors'
conclusions reported in the previous paper still hold and that
Gorban' and Shaykevich have used an incorrect interpretatioi-,.
There are 2 figures.
SURMWTED: January 12, 1962
Card 1/1
39869
S/C5l/62/Gl3/0C2/'GG3/Gl4
E032/E514 ~,
AUTHORS: Vlasenko, N.A.,,Miloslavskiy,V.K.-and Shklyarevskiy,I.N.
TITLE: On the origin of Brewster and super-position fringes
PERIODICAL: Optika i spektroskopiya, v-13, no.2, 1962, 250-255
TEXT: The conditions necessary for the appearance of Brewster
frin6es in white light and super-position fringes in monochromatic-
light are discussed in the general case with allowance for
multiple reflections within each plate. The two types of fringes
are carofully defined and the differences between them are
brought outs In each case an explicit relation is'given for the
intensity distribution. In the case of Brewster fringes, the
corresponding intensity-distribution formula is used to establish
a condition for the continuity of the achromatic fringe. In
fact the achromatic fringe is continuous (visual observation)
provided t &-,) > 2.5, where t is the plate thickness hnd A-,) is
the wave number difference corresponding to the spectral range
employed. The final section is concerned with the analysis of
Brewster fringes which are produced when a two-beam interferometer,
e.g. the Jamin interferometer, is crossed with a silvered plane-
Card 1/2
On the origin of Brewster and ... S/051/62/013/002/008/014
E032/E514
parallel plate. Analysis of the corresponding intensity
distribution shows the presence of several achromatic fringes
and it is suggested that these fringes may be useful in speeding
up the adjustment of two-beam interferometers. They may also be
the measurement of the thicil
useful in rapid-order counting and Cness
of plane-parallel layers. There are 5 figures.
SUBMITTED: July 17, 1%61
I.Card 2/2
/014/00it/013/026
s/o5i/63
Eo3g/F.420
AUTFJOn: mooslavskiy. V.9.
The optical properties of thin US layers in the
I region 0.4 to-18 IL
spectra
PERIODICAL: Optil-a i spolctroskopiyA, v.11j, no.11,_ 1963, 527-531
TEXT- Layers. of,CdS are prepared -by-vacuum evaporation from blo''
and Ta ova'poratord. Partial dissociation of CdS occurs when
heated near to r
its'.sublimation tomperatu o in Vacuo. Tito US
layers therefore contain a surplus of Cd metal which alters their
conductivity. : This surplus of Cd can be determined
T' investigations in the infrared-region of tile
cheittical ly Or
spectrunt layer -built up.on thin slices
a of CdS$:2 to 3~ thi k,wore
qr r6ck..;a1t.' The'. transmissioa. of these layers was measured in
tile WaveLength range 0. 4 to 18 ~,i - by ~ means or a: MKC -2 (IKS-2)
spectrophotometer. Typical results show good transmission in the
-:.-range 2 to- 5 tA while' a noticeable absorption occurs at-longer
Wavelengths.: This absorption increases with increasing X and
he' ' mple In order to
"also w i h incroasing,conductivity 'o-r:t sa
1. o "Ah6 dependence o
elucidate the-naturelof these -observat nis
C rd 1/2
ArD 11 June
AMPI.~JFJCATION OF MACNETOOPTICAL EFFECTS (USSR)
Milosh!I~~V. K.'_ Optika- i spektroskoplya, v. 14, no. 4, AprI953, 532-536.
S/051/631014/004/014/026
The principle of multiple-beam interference is considered. as a rneansof ampli fylrjg
-the magnetooptical Far-aday and Kerr effects. ~ Because of excessive absorption in the
visible portion of the spectrum, semiconductors are regarded as inferior to dielec-
trics.used ir. ., -.'iunction with highly reflective coatincts. . Interference p"D10filters
filled with a dielectric coated with partially transparent metal were used in an ex-
perimental study of the Faraday effect. Filters with a 0.95 reflectivity coefficient
can increase the rotation of polarization plane 20 times, permitting. the use of much
thinner dielectric films to observe the F araday elf-fect. When Polarization ellipticity
is ac.dounted I"or in the Kerr-eflfv~ct rotation an-le, its Ifunction. of phase difference
show4 an asymmetry which has been cyperinientally observed in such specimens as
permRIloy- oxide, stleel-oxide, and steel- quartz -silver. [JA
Card 1/1
LY-(, :311'-- ~-H, , ~S. 1'. ; i"I'l II Y, V - K.
Detemining the effective mass in tin dicxide from 0-.,Lical
constants in the infrared region. Fiz. tver. tGla 6 no.8.:2560-
2562 Ag 164. (Ilip," 1,7: 11)
1. laarlkovskiy gosudarstvenriyy universitet imeni Grr I knjo.
ACCrSSION XR: AP4011498
S/0052/64/016/001/0151/0153
AUT11OR: Lyashenko,,S.P.; Miloslavskiy, V.K.
TXTIX: A ~implc method for determining the thickness and optical constants of seid-
conductor and dielectric layers
SOURCE: Optika i spektroskopiya, v.16, no.1, 1964, 151-153
TOPIC TAGS: optical constant, index of refraction, absorption coefficient, trans-
mittance, layer thickness, dielectric layer, dielectric coating, semiconductor
layer, semiconductor coating :
A13STIZACT: A method is proposed for determining the thickness and the optical con-
stants (the index of refraction n and the absorption coefficient k) of semiconduc-
tor and dielectric layers. Whereas conventional procedures are based on either si-
multaneous measurement of the reflection coefficient R at normal incidence. the
transmiUance T and independent measurement of the thickness or on comparison of
the transmittance (or reflection) for two different thicknesses, the present method
is based on measurement of the transmittance T in a wide spectral range. The method
can be used in pll cases hen thefe Is an extensive region wherein n Is such great-
er than k. Formulas are al:ucod f6r evaluating n, k and thii thickness from the suc-
Card 2/2
ACC.*R-. AP4011498
cessive maximum and =in" Valuds of T. BY Way Ofoillustration the optical con-
staq,ts are computed for #a SnO2 layer on the basisrof an experlmental T versus X
cury'e. It is n9ted that althoughfithe accuracy of the proposed methaid for determin-
ing the thickness and o*ical constants is not an high. as that of the conventional
interferometrlip method At"-Is adequate inquany casemi. Or1C.art.has: 9 formulas,
2 figures and I table.
ASSOCIATION: n9ne
SUBMITTED: 249ar63 DATE ACQ: l4Feb64 ENCL: 00
SUB CODE: PH NR UP SOV- 003 0MR.. 001
it
2/2
Cold
r
,14k~O-SLAVSKIY, V.K.; SHRYOUSKIY, I.N.
Further on the appearance of Brewster bands and superposition
bands. Opt. i spektr. 16 no.3:528-529 Mr 164. (14IRA 17:4)
MILOSLAVSKIY, V.K.
% .............. w---- -, ,
Characteristics of the Faraday effect in thin absorbing filzo, Opt. i
opektr. 17 no.3:413-417 S 164. (MIRA 17:10)
L 34545-65- W7(1,)/=- (WEEC(b)-2 Pi-.4 WP(b)
ACCESSION NR.i AP4048751 s/oo5lA4/017/005/0765/0770
AUTHORS: Shklyarevskiy, 1. N.; K Goloyadova, V. 1.
L~si kt k
L
De ros OF~~&~_
TOPIC TAGSi'.'~ -1 1:
ieffit'Ambakference, uminescence, coherent optical
propagati,on:
ABSTRAM. A quantitative study was made of interference of lumines-
cence light with an angle (p = 1800 between the interfering beams.
Such measurements have become feasible only recently by the avail-
ability of modern equipment with which to measure weak radiation. A
thin luminescent layer (solution of pyrazoline and polystyrene in an
organic solvent) was deposited on a thin mica plate (5--10 ~L). After
evaporation of the solvent the layer had approximately the same re-
fractive index as the mica. The second side of the mica was covered
L 34545-65
ACCESSION kR":' 464~.8751,
"tr-a~nspa-reht-._~ _f silver (refledtIoncoefficient on
with a* -semi I er-o
the micasldia,about~..85% for X =.550.nm. The sample was placed in
front of the spectroscope slit and illuminated, as shown in Fig. 1
of the Enclosure by:ultraviolet light (X = 365 nm). The lumines-
cence propagating -along the normal from the sample surface was
passed through_ a.monochromator and recorded with a photoelectric set-
up using an~ FEU.-,2.~~k--.-ljho.to,multiplier. A system of interference
lin.es of 6onstantwavielengthwas produced by the plane-parallel gap
,mica an
comprising-t-he the luminescent layer. The visibility of
the interference lines' was recorded and compared with calculations
based on the plane-wave approximation. The experimental visibility
was lower than calculated, owing to non-uniformity of the thickness
of the luminescent layer, light scattering by various defects, and
other unaccounted for factors. Orig. art. hast 5 figures.
ASSOMATION: None
-7 IA.
riq, 1. Schemtic arranaemmt of
illumination syjter~
L F
PW-2
.cart(
bo
L
-ACCESSION NR: AP5012574 UiR/0181/65/007/005/15 W
AUTHOR: 14loslavsklyj V. K. Lyashenkop S. P.
n
TITM: Concentration shift or the edge or the intrinsic absorption band 11 0
dioxide
SOURCE: "Lika, tverdogo tela, V. 7., no- 5.- 1965.- 1550-1552
TOPIC TAGS: tin compoundp absorption edgej, refractive index, light transmission
ABSTRACT: The authors observed and investigated the shift of the intrinsic
tion edge,of SnO21 the red boundar7 of which is located at 4 eV. The measurements
were made on polycrystalline layers deposited on a quartz substrate. The electron
density was varied by introducing antimoqr atoms. The refractive index (n - 1.93)
was determined from interferometric transmission curves in the visible region. The
width of the forbidden band was 3.9T eV,,* in fair agreement with data on temperature',
t
measurements of the conductivity. The experimental points fit well the theoreticaL
formula for the,connection between the shift and the electron density. The value
of the reduced effective mass, (0.48 � 0.02)m, necessary to reconcile these
data WithLthe theoryy is close to the value of p obtained from the spectral varia-
tion of the absorption of the eample.with the lowest electron density. On the
other handp the value of obtained in the present work differs noticeably from
Card
t 00679-66
ACCESSION NR i AP5012574
~_,Ithe ohmic reffective mass obtained from the spectritl variation of the real part of
the dielectric constant in an earlier investigation by the authors (nT v. 6, 256o,
19&). The difference Is attributed to anisotropy of the dispersion in the con-
iduction band* Or1g. art. has,. 2 figures and 2 formulas.
ASSOCIATION: Kharlkovskiy gosudaretvennyy universitet (Khar1kov State University)
SUBMITMM: 05Nov& ENCL: 00 OP
MM CODE: GSP
.,.NR REF SOV: 003 OTHER: 004
C
Jjp(c) JDIGG
EWT(1)/EV1TW/EPF(C)/EWP( VT/EWP(t)1Et4P%1'~V'
L 4448-66
~ACCESSION NR: AP5017899 UR/0051/65/019/001/0108/0114 -
535-32 + 535-341
AU"
111ORS: Ejashenko, S. 1-; Miloslavokly, V. K.-
TY'5_5 5
Study of the optical properties of tin dioxide thin films in
the visible and ultraviolet regions "I-
12~7 TV-7.7; 1"6
SOURCE: OPt1ka i spektrookopiya, v. 19, no. 1, 1965, 108-114
TOPIC TAGS: tin compound, optic measurement, optic property, optic
spectrum, UV spectrump absorption edge
ABSTRA:6T*: in view oIf the appreciable divergence of the results ob-
tained by different.authors, apparently owing to the,use of different
,criteria.for eatimating the edge of the.fundamental band, the authors
'investigated,tbe optical constants of thin SnO. films with different
carrier densift Ies in the range from 1.1 to 0.23 p.-Phin layer of
SnO was deposited on a quartz,plate heated to temperature > 500C by
.2
A.method described by ~he authors earlier (Opt. i- -spektr, 8,,' 868,,
1 4448-66
ACCESSION NR: AP5017899
-1960)i The transmission and reflection of the samples was measured
'with a spectrophotome-ter (SF-4). The optical constants and the thick-
ness of the layer were measured from the interference transmission
,
.curves, as described by the authors earlier (Opt. i spektr. v. 16, 80,
a
A special attachment for.the spectrophotometer was used to
.measure the reflection coefficient at wavelengths shorter than 0.35 tL, '-V
The results show that for energies greater than 4 eV the absorption
Is due to the direct allowed interband transitions, and that for
jower energies it depends on the lattice imperfections. The frequenc
:dependence of the absorption of strongly doped samples was explained.
The temperature de-
on the basis of the theory of distorted bands.
,,
pendence of the absorption edge was also investigated and it was
-ifound that the absorption edge increases linearly with decreasing
-;4
Umperature, at,an average rate of 6.5 x 10 ev/deg. The actual'-
ivalue of the absorption.ed e depends on-the carrier density, ranging
.
perature. !The authors
from
approximately 3.'8 to Z4 ev..at room tem
_
,'f6r-
,
thank I. N. Shklyarevskiy anti R.A. 'iarov&_,
valuable discussions.'
,
,
,
.
r g ar has,.F~_rlgures and rormuias-,
_
,
'.6rd
I
17878-66 W(l)
ACC NRs AP5027673 SOURCE Colso UN(b051A5/019/005/0M/W"
AUTHORt MaeUvoklys To 9q F^sanavt A. N.
MGt none
TITLE z MMjtIpjL*-jM" interference in a wedge
soURcIt IOptika I spektrookoplyat T. 19# Do* 5P 1965P 7W-7"
wave "chanlost
TOPIG TAGM7 maculation light reflection coefficient, light
interferencel light source
ABSMCTs Multiplo-wave Interference Amn a point source situated near an air
wedge was theoreticallr interpreted by plotting the sequence of Inaginary source
formefi by multiple reflection from two surfaces of the wedge., The sequence of
coherent sources was eltu&W In the main section of the wedge (in the plans
perpendicular to the aide of the wedge) on.the circle passing through the real
source and having a center In the side of the wedge* -The circle on which the
locallsation'of Interference fringes was observed passed througft the Aft of the
wedge and was tangent to the circle of asherent sources in the point of a true
sources. It was shown that the conditions of a dIstIn4A visibility we qontro
L UbCs $35o412
is the coefficient of reflection age e1tWilaceso The linear sixe of the
(uhare I 1e the avarag angle of
source can be evaluated MrQ*ZAUFds -qs!,Kcosj