SCIENTIFIC ABSTRACT ZHIDKOV, S.K. - ZHIDKOVA, Z.V.

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CIA-RDP86-00513R002064720020-8
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December 31, 1967
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SCIENTIFIC ABSTRACT
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. tj 1 j .1 1 ! Tit ""l III F 11 !, ~~ 1 , tj t it il 1 ! -!;', 1 -1. .1-1 !. ~! -i " , I ' 1 14, 11: ;R 9 ; - t t ;t F :4 ~4?, 413 9 Li E :*,,~ ,0411 1. . !I:. i ! ~Ilg I I ~ i ~ I il I ! 1" 11 111 i H, I '~l ~:;4' ~ 'I i r, ; .1 4 : ~ 1 '11:111,01111IN11111if 11IMNIN 1,111C ~, 11", '1 If I - ! i I ; ! . I I i 't c i 1611, ill 11 ~ "I l! I ,a . i 9i I ~ 11 1 t I!f ''fl [ : q~ I ` i ~, %1 j ~, : i I . ; i x ~ 1 t . ~ 1 1 ftc I 11.,M . , ; I- . ~ 11 fil IN 1 . I il IIII I i L . I.i :: I 11, 1i , 1*1111,101,1`4"'Ill " ~ ~ 1 , . i 11 83868 8/1 12/59/000/016/04VO54 A05VA002 Translation fromi Rafe rativnyizhurnal, Elektrotekhnika, 1959, No. 16,.P. 198 34919 AUTHORS: Zhidkov, V. Khomenko, L. 0. TITLE- A Case of-Origination of-Dislocations in Oermanium~l PERIODICAL:, Nauk. shchorichnyk..Radiofiz. fak. aivalk. un-tu, 1957, 'pp. 492-493 (Ukrainian) TEXT; the change of,electrophysioal propertiss of Go singleerystals an a result of heattreatment,at~temperatures of 840-940 C was investigated. The heat treatmant%was~carried out byinduction heating of ainglecrystals grown by ChokhraVsklyls method without*takIng them out of the crystallization furnace. .,Such a heat treatment did not change-the type of conductivity and the apecifio resistance but.reduced,sharply (to 1 microsecond and less) the lifetime of the ..'secondary current carriers especially in the upper part of a crystal(even at a considerably,increased cooling time of a crystal). It is assumed that a crystal isbeing deformed under its own weight (30-50 g) during heating whereby tlze Card 1/2 ;t: ~ H t. I- ; :~l v-A UTHORt ZHIDXOVpV.A., LASMUREV,V,Te. PA 3537 - -- - - : IV d Electric State of Thermal Acceptors in Germanium, sTo h in Yiffu (Diffuziyai slektrioheskoys sootoyaniye tormichookikh Aktoaptorov, v,germaniip Russian) PERIODICALs Zhurnal Tekhn. Fiz-P 1957, Vol 27P Nr 5, 877 - 883 (U-S-SOHO LBSTRLCTs The repetition of the experiments carried out by MLYBURO (phys.Rev., 95, 38, 1954) with samples of different lengths in the vacuum and in a helium atmosphere by using both alternating- and parallel current showed that the process for the removal of thermal acceptors- bv heating electric current is much more complicated than was assumed by.MAYBURG. Germanium monoorystals of prismatic ships and 6 - 30 mm length and a arose section surface of 2 - 8 mm were used. The construction of the apparatus and the method of thermal treatment were described by the authors already in lant ser.fiz., 20, Nr 12, 1956, By hardening by means of switching off the current it is possible to determine the dependence of the concentration of the thermal acceptors la on the time of heating for the various stages of heat treatment. There were 4 such stages* 'It was shown that when passing from heating by means of alternating current to heating by direct current at temperatures of more than 8000 C the speed of purification increased considerably. The ac- celeration of the purification of germanium from thermal acceptors Card .1/2 by means of direct current proves the ionizo4 state of the admixture F it', ji~ I i;$: f 1,11 p- PA. 3537 Diffusion and Elootrio State of Thermal Acceptors In Germanium. under these conditions. The theory of purification is given and compared with the experiment. Experiments showed that the behavior of the aoooptorn removed from the germanium in similar to that of copper in germanium. Exper onto carried out with samploo saturated with radioactive Cu9W showed that after 10 - 3'houre of heating by means of alternating current at 815 - 8500 C a considerable activity of the tantalum electrodes sets in. Binding copper to tantalum which is in contact with germanium has for the first time been proved by this work. The dependence of the diffusion coefficient of the thermal acceptors on temperature was found and a dependence of the name on concentration was presumed. (6 illustrations and 2 Slavic references) ASSOCIATIONt Physical Institute of the Academy of Science of the W.S. R., Kiev State Univerdlity. PRESENTED.Bre SUBMITTEDs 5.11-1956 ~:.AVAILABLEi Library.of Congress, Card 2/2 I.M., kand.tekhn.nauk; SABITVV, M.P., Insh. YMDKOY. ToA. ingli. p 1 p 5/181/61/003/001/024/042 "~',:?'V/ BOO6/BO56 'AUTHORS.-, Belyayevp Yu. I.-and Zhidkovt V. A. TITLE. Diffusion of beryllium in germanium PERIODICAL: Flzika tverdogotela, V'. 3, no. 1,1961, 182-184 Following a previous iaper,(Ref. -1), in which the authors~studied the,olectrioal and-recombination properties of Be-doped germanium, they now report on investigations of diffusion And on the determination of the diffusi6n,ccefficient as well'as the solubility of Be in Go. As:initial substanedt antiinony-doped germanium-single crystals having a*resistivity of~'l 1-8 ohm-cm.were used. The 2 X 3 X 10 mm specimens were etched in boiling Perhydrol, after which a 10~Lthick Be layer was sputtered in vacuo onto th.eir P-nd surfacea. Forthe purpose of rendering diffusion easier, the ecimens we .re heated at 920-7200C in evacuated quartz tu -3 a p bee (10 mm Hg) for 24-15Q hr.~ 'As the Be layer was visible also after this procese,la: continuous subsequent supply of Be.atoms into the interior of the Ge crydals could be assumed. The distribution of these Be atoms may therefore be Card 1/3 S/1 M1/003/001/024/042 Diffusiwof beryllium in germanium Boo67B(0(56 Aesoribel by the relation o(x,t) CoO - t where co ta the limiting 2 VYt concentration of Beq:and D is the diffusion coefficient. By this diffusion of. Be (which is an.acceptor impurity in Ge) a p-- Junction was formed at a certain depth; the depth of, its position could be db6ermined as 15-7014 (arror.+2~L). At each temperature, several specimens with different antimony concentration were investigatedp and thus the donor concentration and also the,p-n junctionfor each sample differed. By removing layersq:, by several measurements of the carrierconcentration, and by determination of theposition of the:p-n.junation, several points on the curve o f(x)~ could.be determined at.~oneand the same temperature. Thus, the depth distribution of the carrier density could be determined. In the diagram shown here, curve 1,ahows the temperature dependence of the diffusion coeffioient ofBe in Ge, curve 2ahows the diffusion coefficients of Zn in Ge,-and curve,3 shows the temperature dependence of the limiting concentra- tion co (right ordinate) on Be in Ge. co was determined from the so.lubi- 7 lity of Be in.Ge at a given temperature. At the point where the thermal probe determined the p-n Junction, p sx n(u-/u+) was found, where n and:p are 'the electron and hole concentration, respectively, and u-, u+ the Card 2/3 31/18 P~'003/001/024/042 'Diffusion of beryllium in germanium B006 B056 7B As Be is doubly:iohized st room temperature, e p/2 -:nu-/2u,. From'thecurve it is possible, with satisfactory accuracy, to determine the.relation D,. 0.5 exp(-2.5/kT) for D. The maximum solubility depends only slightly*on temperature., The;error in D-determination was 2oYc, and -determination, 56~~. , The, authors thank I. A. Radziyevskiy for in the c, placing the Ge 'single arystals.at their disposal. There are I figure 8 references:'4 Soviet-bloc and.4 non-Soviet-bloc. ASSOCIATION: Kiyevskiy ordena Lehina gosudarstvennyy universitet im. T. G. Shavchenko (Kiyev~,-Order of Lenin" State University imeni T. G. Shevchenko) 1960 SUBMITTED: July 20 Card, 3/3 2012~ 8/18 61/003/002/022/050 /0 1~ B102YB212 AUTHOR: Zhidkov, V. A',: TITLE* Constant o6ndentration of thermal acceptors in germanium under vari ous conditions of heat treatment PERIODICA1,; Pixik4 tverdogo tela, v. 31 no. 20 19611 459-463 ..TEXT: Although the constant concentration of thermal acceptors in gar- manium has been repeatedly investigated, to studies have been made over thewhole temperature range (550-930 C) where thermal acceptors can be found. Results of 8uoh inventigatlons show considerable divergence In the range above 7 20 C.. The author reports on studios which have boon, made over a wide temperature interval. The samples have been tleotrically heated in high vacuumj and the ourrent,was applied to them over tantalum electrodes.- The thermal acceptor concentration (activation energy of 0-04 evi has been measured In the center of the samples which where kept in vacuum. The measurements were made via '.he Hall effect at such low temperatures that the concentration of the thermal holeswas constant and equal to thedifference of thermal acceptor concentration and primary ,Card 1/6 20124 Constant concentration of~thermal.... B/181/61/003/002/022'/050. B102/B212 donors. If the heat treatment at constanttemperature lastedlong enough a constant.,value(Nat) of the thermal acceptors was reached. Thesvalue a t of N was mainly a function of purityj and copper,, especially proved a to,,be disturbing. Besides of quartz the vacuum chamber contained only tantalum and m.olybdenum which do not react with germanium. In order to avoid contaminationfrom. the elsotrodesp these tantalum electrodes were 0 heated-in the vacuum to 1500,C and the samples were etched for ton minutes in. boiling perhydrol and after, that washed in distilled water. The electrodes and sample were again subjected to the same process after mounting. ~The heating of the samples with electric current oaused removal of thermal acceptors by.evaporation, diffusion to electrodes or electroly- sis; e.g.p'at a temperature of 6100-7000C (here, evaporation hardly takes place and acceptors are without charge) the sam3les had to be heated for .far above ton hours in order to reach N".4 1.1ol cm-3. It was not a 'possible at those temperatures to remove thermal aqoeptore from unpuri- fied germanium, and.aloo the steady state at NO% for instance is already.reached after ten minutes. Pig. 1 shown a comparison of the Card 2/ 6 2OMt - Constant a ncentration 9 of thermal ... S/18IJ61/003/002/022/050 B102/B212 obtained by V. V Ostroborodova -~uthorla results 0 2 3 4) with those nd a ~MayburgI S. :G. Kalashnikov (full line), (dash-dotted iine), and . Hopkins.et al. (dashed fine). 'i The unetched sam ilea (data 2) yielded the highest Not and under the best teqt conditions the lowest values fox _(4)0 a I(K 5 1013, m 3 values f:iX were obtaink C at 9400C). At a given a* U -e N at, is 6h1 L: function of parity. The valu e and temperature t emperat x - at epe *6f 'are o' d ndence. n1 a function of the degree of 'copper contamina- a, tion. of the germanium sample. 7~The energy model for producing thermal of atoms :shown in Fig. 2 is used to calculate n, the number as acceptors . . . : Nat the number of atoms which are that-have left the lattice nodes and ' occupied by.copper atoms (in equilibrium.state), The following formula is obtained if X >> E C a i7 x' N a p E a it 1 2 - +: 0 XP Ca 3 ~Z t4: i ;. : ~, 1! ~ 'N1 !,.flI i.' ! I . : ': ; - i7 , - , R~ "I I ; 7 1 6 one an concen ration- of'.thermal. S/18 /003/002/022/050 Y B I 02 B 12 2 N'at can-be a plai necl, with',the.-model (Fi g. 2) if it is assumed that Cu. x a in, Ge' can ' b a i n two. di ff eient states (0-04 and'O.25 ev,aotivation energy)-, The author. thanks V. Ye.. Lashkarevi, Academician of the AS UkrSSRp f or i I ref erene as: ~discussion- Frankel' is imentioned. - There are 2fi urea and 5 9 5 Soviet-bloc and .10'no,n-Soviet-bloo. ASSOCIATION: Kiyevskiy ordena Lenina gosuniversitet im. V. G. Shevchenko i 'Institut fiziki AN USSR .(Kiyev Lenin.Order State University imeni T..G4 Shevchenkof Institute of Physics AS UkrSSR) SUBMITTEM~ May 16 1960 ''Card 5 6: W: c d 616~ 20125 S/18 61/003/002/023/050 LL-0 9 IA300 3 S, B102 212 AUTHOR: Zhidkov, V., As TITLE: Thermal acceptors with a high deposition in germanium PERIODICAL: Fizika tyerdogo tela, v, 3, no. 21 1961t 464-475 TEXT: This paper is an addition to the joint effort of.the author and V. ~Ye. Lashkarev, where it had, been. shown that besides thermal acceptors with'& 0.04 ev activation inergyq which are produced in germanium b the influence of temperature, (they are called "low-deposition" acceptors~ but,undercertain conditions there might be also such with a 0.25,ev go- tivation energy ('!high-deposition" acceptorls)i here, the author reports on investigations of "high-deposition" acceptors. The kinetics of low- temperature tempering, the condition-for production of these acceptors the temperature dependenoo,of the constant concentration~and the influence of beat treatment conditions have been atudie T~e initial Go single crystals had a donor concentration of < 10101~_cm and measured 1-3 3.5 20 mm3. Heat treatment was done by electric current passage Card 1/ 6 -20125 - 'Thermal acceptors with,*#!, 5/18IJ61/003/002/023/050 B102/B212 (d.o. and a.o.)t electrodes and probes were made of tantalum. The Hall constant and.6onductivity have been measured In various parts of the samples. - W10 the low-deposition Aoaeptor concentration has boon measured at T < 150 OK~ i.e.t where the.high-deposition acceptors had not been onized. The.high-deposition acceptor concentration N had been do- 2 termined from the temperature dependence of the thermal hole concentration. Special tests which had been performed to determine the upper limit of N furnished the value N -loll cm-31 after high-temperature 2 4-5 14 -3 01013 -3 treatment and for N ad N am the 1.4 10 cm result 2 ' 5.6 high-deposition acceptor ionization starts at T w 1500K. High-deposition. acceptors had only been-found in samples heated to 800-900 0C1 and their concentration is a function ofthe purity of the sample surfaoe,and that of the tantalum electrodes# Etching in.boiling perhydrol add sub- sequent washing In diTtille water made it possible to keep a constant 4 concentration N28